Hostname: page-component-848d4c4894-p2v8j Total loading time: 0 Render date: 2024-05-10T03:48:39.505Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Development at Ti-Based Alloy/Coated SiC

Published online by Cambridge University Press:  15 February 2011

M. Strangwood ,
C.B. Ponton ,
M.P. Delplancke ,
V. Vassileris  and
R. Winand
M. Strangwood
Affiliation:
The University of Birmingham, Faculty of Engineering, School of Metallurgy and Materials, Edgbaston, Birmingham B15 2TT, United Kingdom
C.B. Ponton
Affiliation:
The University of Birmingham, Faculty of Engineering, School of Metallurgy and Materials, Edgbaston, Birmingham B15 2TT, United Kingdom
M.P. Delplancke
Affiliation:
Université Libre de Bruxelles, Faculty for Applied Sciences, Metallurgy-Electrochemistry, 50 av. F.D. Roosevelt, 1050 Brussels, Belgium
V. Vassileris
Affiliation:
Université Libre de Bruxelles, Faculty for Applied Sciences, Metallurgy-Electrochemistry, 50 av. F.D. Roosevelt, 1050 Brussels, Belgium
R. Winand
Affiliation:
Université Libre de Bruxelles, Faculty for Applied Sciences, Metallurgy-Electrochemistry, 50 av. F.D. Roosevelt, 1050 Brussels, Belgium
Get access

Abstract

The kinetics of formation of reaction layers at the interface between a Ti-based alloy (β-21s) and graphite blocks coated first, by CVD techniques, with a 100 μm layer of SiC and then either TiC or C were determined. The rate controlling step for reaction at 900°C and 10 MPa for up to 6 hours was found to be carbon diffusion through the reaction layer. The behaviour was found to be consistent with that of composite systems for prolonged heat treatment and the same growth behaviour was exhibited by both systems. Incubation times of 0.42 and 0.9 hours were determined for reaction layer growth in the TiC- and C-coated systems respectively. The reaction layer/Ti-alloy bond strength was good but all couples failed readily, especially if any C layers remained. The growth conditions of TiC coatings by reactive magnetron sputtering were determined for two different types of gas mixtures: CH4/Ar and C2H2/Ar. The composition and structure of the films were extensively studied.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 343: Symposium H – Polycrystalline Thin Films - Structure, Texture, Properties and Applications , 1994 , 265
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Fox, K.M., Strangwood, M. and Bowen, P., 7th World Congress on Titanium, TMS-AIME, San Diego Google Scholar
2. Martineau, P., Pailler, R., Lahaye, M. and Naslain, R., J. Mater. Sci. 19, 2749 (1984)CrossRefGoogle Scholar
3. Fox, K.M., Strangwood, M., 3rd European Conference on Advanced Materials and Processes, Euromat 93, Journal de Physique IV, Colloque C7, supplement au Journal de Physique III, volume 3, November 1993, pp 1699–1704 Google Scholar
4. Ritchie, I.T., Thin Solid Films 72, 65 (1980)CrossRefGoogle Scholar
5. Sundgren, J.-E., Johansson, B.-O. and Karlsson, S.-E., Thin Solid Films 105, 353 (1983)CrossRefGoogle Scholar
6. Sundgren, J.-E., Johansson, B.-O., Karlsson, S.-E. and Hentzell, H.T.G., Thin Solid Films 105, 367 (1983)CrossRefGoogle Scholar
7. Vassileris, V., Delplancke, M.P. and Winand, R., to be publishedGoogle Scholar
8. Fox, K.M., Strangwood, M. and Bowen, P., Interfacial Phenomena in Composite Materials, Cambridge, to be published in CompositesGoogle Scholar
9. Strangwood, M., Fox, K.M., Bowen, P. and Cotterill, P.J., EMAG 93, Institute of Physics Conference Series No. 138: Section 8, Bristol, 1993, pp 391–394 Google Scholar