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Microstructure Characterization of Ceramics by Fractal Geometry

Published online by Cambridge University Press:  10 February 2011

Z. X. Xiong ,
K. Z. Baba-Kishi  and
F. G. Shin
Z. X. Xiong
Affiliation:
Department of Applied Physics and Materials Research Center, The Hong Kong Polytechnic University, Hong Kong, E-mail: 95980474R@HKPUCC.POLYU.EDU.HK
K. Z. Baba-Kishi
Affiliation:
Department of Applied Physics and Materials Research Center, The Hong Kong Polytechnic University, Hong Kong.
F. G. Shin
Affiliation:
Department of Applied Physics and Materials Research Center, The Hong Kong Polytechnic University, Hong Kong.
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Abstract

Following Mandelbrot's fractal theory, the irregular characteristics of the microstructural features of ferroelectric Pb(Sc0.5 Ta0.5)O3 ceramics, including grain boundaries and dislocation networks, were investigated. The microstructural features were imaged by electron microscopy. The fractal analyses were carried out manually and by image processing techniques, which show the value of the fractal dimension, D, varies according to the regularity of the microstructure. The value of, D, close to unity is an indication of an increasing degree of microstructural regularity, which is in good agreement with the simulated results.

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References

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