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Mimicking the Real World and Exploring New Ones with In-Situ Electron Microscopy

  • A. Howie (a1)
Abstract

Recent progress with in-situ observations by electron microscopy is briefly surveyed by referring to developments in instrumentation for reflection and low energy electron imaging as well as for high resolution transmission imaging and spectroscopy. New opportunities have been opened up by environmental microscopy. With increased levels of illumination intensity, the ever present question of beam-induced effects is of mounting concern particularly in studies of non-metallic materials.

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