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Morphology of Sn Films Grown on the Fivefold Surface of Icosahedral Al63Cu24Fe13 Investigated by Scanning Tunneling Microscopy

Published online by Cambridge University Press:  01 February 2011

H. R. Sharma ,
M. Shimoda ,
J. A. Barrow ,
A. R. Ross ,
T. A. Lograsso  and
A. P. Tsai
H. R. Sharma
Affiliation:
SORST, Japan Science and Technology Corporation, Japan
M. Shimoda
Affiliation:
SORST, Japan Science and Technology Corporation, Japan National Institute for Material Science, 1–2–1 Sengen, Tsukuba-shi, Ibaraki 305–0047, Japan
J. A. Barrow
Affiliation:
Department of Chemistry, Iowa State University, Ames, Iowa 50011, USA Ames Laboratory, Iowa State University, Ames, Iowa 50011, USA
A. R. Ross
Affiliation:
SORST, Japan Science and Technology Corporation, Japan Department of Materials Science and Engineering, Ames, Iowa 50011, USA
T. A. Lograsso
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa 50011, USA Department of Materials Science and Engineering, Ames, Iowa 50011, USA
A. P. Tsai
Affiliation:
SORST, Japan Science and Technology Corporation, Japan National Institute for Material Science, 1–2–1 Sengen, Tsukuba-shi, Ibaraki 305–0047, Japan
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Abstract

Sn film growth on the fivefold surface of icosahedral Al63Cu24Fe13 has been investigated by employing scanning tunneling microscopy. For about monolayer coverage, the deposited Sn forms a layer of monoatomic height. A Fourier transform of the layer's structure reveals quasicrystalline long range order. At higher coverage, flat-topped clusters of uniform heights are formed. The clusters preferentially grow at the step edges.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 805: Symposium LL – Quasicrystals , 2003 , LL7.11
Copyright
Copyright © Materials Research Society 2004

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References

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