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Multi-Frequency Atomic Force Microscopy Combining Amplitude- and Frequency-Modulation Techniques

Published online by Cambridge University Press:  30 March 2012

Santiago D. Solares  and
Gaurav Chawla
Santiago D. Solares
Affiliation:
Department of Mechanical Engineering, University of Maryland, 2181 Glenn L. Martin Hall, College Park, MD 20742, U.S.A.
Gaurav Chawla
Affiliation:
Department of Mechanical Engineering, University of Maryland, 2181 Glenn L. Martin Hall, College Park, MD 20742, U.S.A.
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Abstract

Multi-frequency atomic force microscopy (AFM) offers additional response signals in comparison to traditional dynamic AFM. Furthermore, depending on the mode of operation used, the higher eigenmode responses are generally not directly influenced by the topographical acquisition control loops, such that they can explore a fuller range of tip-sample interactions. In this work we describe the implementation of multi-frequency imaging schemes that enable the acquisition of topographical, phase and frequency shift contrast in tapping-mode operation. This type of characterization can be especially useful for soft, highly dissipative samples, such as polymers, for which the various response channels can exhibit significantly different response, thus providing complementary information. We discuss typical results obtained as well as important challenges that need to be addressed in order to develop a fully quantitative technique.

Keywords

scanning probe microscopy (SPM)microstructureviscoelasticity

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1422: Symposium QQ – Functional Imaging of Materials–Advances in Multifrequency and Multispectral , 2012 , mrsf11-1422-qq03-07
Copyright
Copyright © Materials Research Society 2012

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References

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