Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-23T22:41:35.877Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanostructured epitaxial thin films of Fe-based superconductors with enhanced superconducting properties

Published online by Cambridge University Press:  13 August 2012

P. Mele ,
K. Matsumoto ,
H. Nagayoshi ,
K. Fujita ,
Y. Yoshida ,
Y. Ichino ,
T. Kiss ,
A. Ichinose ,
M. Mukaida  and
B. Maiorov
...Show all authors
P. Mele
Affiliation:
Institute for Sustainable Science and Development, Hiroshima University, Kagamiyama 1-3-1 Higashi-Hiroshima 739-8530, Japan
K. Matsumoto
Affiliation:
Department of Materials Science and Engineering, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
H. Nagayoshi
Affiliation:
Department of Materials Science and Engineering, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan
K. Fujita
Affiliation:
Department of Materials Science and Engineering, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan
Y. Yoshida
Affiliation:
Department of Energy Engineering and Science, Nagoya University, Furo-cho, Chikikusa-ku, Nagoya 464-8603, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
Y. Ichino
Affiliation:
Department of Energy Engineering and Science, Nagoya University, Furo-cho, Chikikusa-ku, Nagoya 464-8603, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
T. Kiss
Affiliation:
Department of Electrical and Electronic Systems Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 812-8581, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
A. Ichinose
Affiliation:
Electric Power Engineering Research Laboratory, Central Research Institute of Electric Power Industry, 2-6-1 Nagasaka, Yokosuka, Kanazawa 240-0196, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
M. Mukaida
Affiliation:
Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 812-8581, Japan JST-TRIP, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan
B. Maiorov
Affiliation:
MPA-NHMFL and MPA-STC, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
F.F. Balakirev
Affiliation:
MPA-NHMFL and MPA-STC, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
S.A. Baily
Affiliation:
MPA-NHMFL and MPA-STC, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
L. Civale
Affiliation:
MPA-NHMFL and MPA-STC, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
Get access

Abstract

Epitaxial Fe-Te-Se thin films were deposited by pulsed laser deposition at 250 ~ 600 °C on SrTiO3 (100, STO), MgO (100), LaAlO3 (100, LAO) and CaF2 (100) single crystal substrates. Best superconducting film was grown on CaF2: Tconset = 20.0 K and Tc0 = 16.18 K with Tdep = 300 °C, 45000 pulses, 3 Hz. The critical current density Jc at 4.2 K was 0.41×106A/cm2 at 0 T and 0.23×106 A/cm2 at 9 T. Angular dependence of Jc showed broad c-axis correlated peak when B ≥ 3 T.

Keywords

superconductingthin filmlaser ablation
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1434: Symposium I – Recent Advances in Superconductors, Novel Compounds and High-Tc Materials , 2013 , mrss12-1434-i11-01
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kamihara, Y., Watanabe, T., Hirano, M., Hosono, H., J. Am. Chem. Soc. 130, 3296 (2008).Google Scholar
2. Ishida, K., Nakai, Y., Hosono, H., Japan. Journal Appl. Phys 78, 062001 (2009).Google Scholar
3. Wang, X. C., Liu, Q. Q., Lv, X. Y., Gao, W. B., Yang, L. X., Yu, R. C., Li, F. Y., Jin, C. Q., Solid State Commun. 148, 5382008 (2008).Google Scholar
4. Rotter, M., Tegel, M., Schellenberg, I., Hermes, W., Pöttgen, R., Johrendt, D., Phys. Rev. B 78, 020503 (2008).Google Scholar
5. Hsu, F. S., Luo, J. Y., Yeh, K. W., Chen, T. K., Huang, T. W., Wu, P. W., Lee, Y. C., Huang, Y. L., Chu, Y. Y., Yan, D. C., Wu, M. K., Proc. Natl. Acad. Sci. U.S.A. 105, 14262 (2008).Google Scholar
6. Hiramatsu, H., Katase, T., Kamiya, T., Hirano, M., Hosono, H., Appl. Phys. Express 1, 101702 (2008).Google Scholar
7. Baily, S. A., Kohama, Y., Hiramatsu, H., Maiorov, B., Balakirev, F. F., Hirano, M., Hosono, H., Phys. Rev. Lett. 102, 117004 (2009).Google Scholar
8. Iida, K., Hanisch, J., Trommler, S., Matias, V., Haindl, S., Kurth, F., Lucas del Pozo, I., Hühne, R., Kidszun, M., Engelmann, J., Schultz, L., Holzapfel, B., Appl. Phys. Express 4, 013103 (2011).Google Scholar
9. Lee, S., Jiang, J., Zhang, Y., Bark, C. W., Weiss, J. D., Tarantini, C., Nelson, C. T., Jang, H. W., Folkman, C. D., Baek, S. H., Polyanskii, A., Abraimov, D., Yamamoto, A., Park, J. W., Pan, X. Q., Hellstrom, E. E., Larbalestier, D. C., and Eom, C. B., Nature Materials 9, 397 (2010).Google Scholar
10. Braithwaite, D., Lapertot, G., Knafo, W., I. and Sheikin, , J. Phys. Soc. Japan 79, 053703 (2010).Google Scholar
11. Wu, M. K., Hsu, F. S., Yeh, K. W., Huang, T. W., Luo, J. Y., Wang, M. J., Chang, H. H., Chen, T. K., Rao, S. M., Mok, B. H., Chen, C. L., Huang, Y. L., Ke, C. T., Wu, P. M., Chang, A. M., Wu, C. T., Perng, T. P., Physica C 469, 340 (2008).Google Scholar
12. Han, Y, Li, W Y, Cao, L X, Xu, B, Zhao, B R 2009 J. of Physics: Cond. Matter 21 235702 Google Scholar
13. Nie, Y. F., Brahimi, E., Budnick, J. I., Hines, W. A., Jain, M., Wells, B. O., Appl. Phys. Lett. 94, 242505 (2009).Google Scholar
14. Mele, P., Matsumoto, K., Haruyama, Y., Mukaida, M., Yoshida, Y., Kiss, T., Appl. Phys. Express 2, 073002 (2009).Google Scholar
15. Mele, P., Matsumoto, K., Haruyama, Y., Mukaida, M., Yoshida, Y., Kiss, T., Supercond. Sci. Technol. 23, 052001 (2010).Google Scholar
16. Kumary, T. G., Baisnab, D. K., Janaki, J., Mani, A., Sarguna, R. M., Ajikumar, P. K., Tyagi, A. K., Bharathi, A., Supercond. Sci. Technol. 22, 095018 (2009).Google Scholar
17. Si, W., Lin, Z. W., Jie, Q., Yin, W. G., Zhou J, J., Gu, G., Johnson, P. D., Li, Q., Appl. Phys. Lett. 95, 052504 (2009).Google Scholar
18. Bellingeri, E., Buzio, R., Gerbi, A., Marrè, D., Congiu, S., Cimberle, M. R., Tropeano, M., Siri, A. S., Palenzona, A., Ferdeghini, C., Supercond. Sci. Technol. 22, 105007 (2009).Google Scholar
19. Imai, Y., Tanaka, R., Akiike, T., Hanawa, M., Tsukada, I., Maeda, A., Physica C 470, 1038 (2010).Google Scholar
20. Imai, Y., Akiike, T., Tsukada, I., Maeda, A., Hikage, T., Kawaguchi, T., Ikuta, I., Appl. Phys. Express 3, 04310 (2010).Google Scholar
21. Hanawa, M., Ichinose, A., Komiya, S., Tsukada, I., Imai, Y., Maeda, A., Japan. J. Appl. Phys. 51, 010104 (2012).Google Scholar
22. Li, Q., Si, W., Dimitrov, I., Rep. Prog. Phys. 74, 124510 (2011).Google Scholar
23. Han, Y., Li, W. Y., Cao, L., Wang, X. Y., Xu, B., Zhao, B. R., Guo, Y. Q., Yang, J. L., Phys. Rev. Lett. 104, 017003 (2010).Google Scholar
24. Si, W., Zhou, J., Jie, Q., Dimitrov, I., Solovyov, V., Johnson, P. D., Matias, V., Sheehan, C., Li, Q., Appl. Phys. Lett. 98, 262509 (2011).Google Scholar
25. Tsukada, I., Hanawa, M., Akiike, T., Nabeshima, F., Imai, Y., Ichinose, A., Komiya, S., Hikage, T., Kawaguchi, T., Ikuda, H., Maeda, A., Applied Physics Express 4, 053101 (2011).Google Scholar
26. Chen, L., Tsai, C.-F., Zhu, Y., Chen, A., Bi, Z., Lee, J., Wang, H., Supercond. Sci. Technol. 25, 025020 (2012).Google Scholar
27. Eisterer, M., Raunicher, R., Weber, H. W., Bellingeri, E., Cimberle, M. R., Pallecchi, I., Putti, M., Ferdeghini, C., Supercond. Sci. Technol. 24, 065016 (2011).Google Scholar
28. Mizuguchi, Y. and Takano, Y., J. Phys. Soc. Japan 79, 102001 (2010).Google Scholar