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Nanotube Carbon Structure Tips - A Source of High Field Emission of Electrons

Published online by Cambridge University Press:  15 February 2011

Leonid A. Chernozatonskii
Affiliation:
Institute of Chemical Physics, Moscow 117334, Russia
Yu.V. Gulyaev
Affiliation:
Institute of Radio Engineering and Electronics, Moscow 103907, Russia
Z.Ja. Kosakoyskaja
Affiliation:
Institute of Radio Engineering and Electronics, Moscow 103907, Russia
N.I. Sinitsyn
Affiliation:
Institute of Chemical Physics, Moscow 117334, Russia
G.V. Torgashov
Affiliation:
Institute of Chemical Physics, Moscow 117334, Russia
E.A. Fedorov
Affiliation:
Institute of Radio Engineering and Electronics, Moscow 103907, Russia
Yu.F. Zakharchenko
Affiliation:
Institute of Radio Engineering and Electronics, Moscow 103907, Russia
V.P. Val'chuk
Affiliation:
Institute of Radio Engineering and Electronics, Moscow 103907, Russia
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Abstract

We present the finding of experiments of considerable field emission from the films consisting of nanotube carbon structureson various substrates (Si, quartz, glass): density of emission current was up to 1-3 A/cm2 while electric field was about 100 V/μ. The “reconstruction” and “inversion” of field emission have also been observed after current breakdown.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Iijima, S., Ichihashi, T., Ando, Y., Nature 356, 776 (1992). R.W.Wood, Phys.Rev. 5 (1897) 1.Google Scholar
2. Kosakovskaja, Z.Ja., Chernozatonskii, L.A., Fedorov, E.A., Pis'ma Zh. Eksp. Teor. Fiz. 56, 26 (1992) [JETP Lett. 56, 26 (1992)].Google Scholar
3. Chernozatonskii, L.A., Fedorov, E.A., Kosakovskaja, Z.Ja., Panov, V.I., Savinov, S.V., Pis'ma Zh. Eksp. Teor. Fiz. 57, 35 (1993) [JETP Lett. 57, 35 (1993)].Google Scholar
4. Chernozatonskii, L.A., Kosakovskaja, Z.Ja., Kiselev, A.N., Kiselev, N.A., Chem.Phys.Lett. 228, 94 (1994).Google Scholar
5. Chernozatonskii, L.A., Kiselev, A.N., Kiselev, N.A., Kosakovskaja, Z.Ja., presented at Phys. Lett. (unpublished).Google Scholar
6. Ebbesen, T.W. and Ajayan, P.M., Nature, 358, 220 (1992).Google Scholar
7. Spindt, C.A. et al. J.Appl.Phys. 47, 5248 (1976).Google Scholar
8. Xie, C., Kumar, N., Collins, C.B., Lee, T.J., Schmidt, H., Wagal, S., Proceedings of. 6 Int. Vacuum Microel. Conf., Newport, 162 (1993).Google Scholar
9. Chernozatonskii, L.A., Chem.Phys.Lett. 209, 229 (1993).Google Scholar
10. Rouff, R.S., Tersoff, J., Lorents, D.C., Subramoney, S., Chan, B., Nature 364, 514 (1993).Google Scholar
11. Patel, J.S. and Yokoyama, H., Nature 362, 82 (1992).Google Scholar