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A New Approach Towards Property Nanomeasurements Using In Situ TEM

Published online by Cambridge University Press:  10 February 2011

Z.L. Wang ,
P. Poncharal ,
W.A. De Heer  and
R.P. Gao
Z.L. Wang
Affiliation:
School of Materials Science and Engineering Atlanta GA 30332-0245
P. Poncharal
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta GA 30332-0245
W.A. De Heer
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta GA 30332-0245
R.P. Gao
Affiliation:
School of Materials Science and Engineering Atlanta GA 30332-0245
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Abstract

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechancial and electrical properties of individual nanotube-like structures by in-situ transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing an one-to-one correspondence in structure-property characterization. Applications of the technique will be demonstrated on mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f= 10−15).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 217
Copyright
Copyright © Materials Research Society 2001

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References

1.Wang, Z.L. (ed.), Characterization of Nanophase Materials, Wiley-VCH, New York (1999).Google Scholar
2.Poncharal, P., Wang, Z.L., Ugarte, D., and Heer, W.A. de, Science 283, 1516 (1999).Google Scholar
3.Wang, Z.L., Poncharal, P., and Heer, W.A. de, J. Phys. Chem. Solids, in press (2000).Google Scholar
4.Wang, Z.L., Poncharal, P., and Heer, W.A. de, Microscopy and Microanalysis, in press (2000).Google Scholar
5.Meirovich, L., Element of Vibration Analysis, McGraw-Hill (New York) (1986).Google Scholar
6.Gao, R.P., Wang, Z.L., Bai, Z.G., Poncharal, P., and Heer, W.A. de, Phys.l Rev. B, in press (2000).Google Scholar
7.Heer, W.A. de, Chatelain, A., and Ugarte, D., Science 268, 845 (1995).Google Scholar
8.Frank, S., Poncharal, P., Wang, Z.L., and Heer, W.A. de, Science 280, 1744 (1998).Google Scholar