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Nondestructive Imaging of Materials Microstructures Using X-Ray Tomographic Microscopy

Published online by Cambridge University Press:  21 February 2011

J.H. Kinney ,
M.C. Nichols ,
U. Bonse ,
S.R. Stock ,
T.M. Breunig ,
A. Guvenilir  and
R.A. Saroyan
J.H. Kinney
Affiliation:
Chemistry and Materials Sciences Department, Lawrence Livermore National Laboratory, Livermore CA 94550
M.C. Nichols
Affiliation:
Sandia National Laboratories, Livermore CA 94550
U. Bonse
Affiliation:
Department of Physics, University of Dortmund, Dortmund Germany
S.R. Stock
Affiliation:
School of Materials Engineering, Georgia Institute of Technology, Atlanta GA 30332
T.M. Breunig
Affiliation:
School of Materials Engineering, Georgia Institute of Technology, Atlanta GA 30332
A. Guvenilir
Affiliation:
School of Materials Engineering, Georgia Institute of Technology, Atlanta GA 30332
R.A. Saroyan
Affiliation:
Chemistry and Materials Sciences Department, Lawrence Livermore National Laboratory, Livermore CA 94550
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Abstract

A technique for nondestructively imaging microstructures of materials in situ, especially a technique capable of delineating the time evolution of chemical changes or damage, will greatly benefit studies of materials processing and failure. X-ray tomographic microscopy (XTM) is a high resolution, three-dimensional inspection method which is capable of imaging composite materials microstructures with a resolution of a few micrometers. Because XTM is nondestructive, it will be possible to examine materials under load or during processing, and obtain three-dimensional images of fiber positions, microcracks, and pores. This will allow direct imaging of microstructural evolution, and will provide time-dependent data for comparison to fracture mechanics and processing models.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 217: Symposium U – Advanced Tomographic Imaging Methods for the Analysis of Materials , 1990 , 81
Copyright
Copyright © Materials Research Society 1991

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References

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