Hostname: page-component-cb9f654ff-lqqdg Total loading time: 0 Render date: 2025-09-07T06:20:25.702Z Has data issue: false hasContentIssue false
  • English
  • Français

Novel approaches for the characterization of electromagnetic fields using electron holography

Published online by Cambridge University Press:  01 February 2011

Takeshi Kasama ,
Yanna Antypas ,
Ryan K.K. Chong  and
Rafal E. Dunin-Borkowski
Takeshi Kasama
Affiliation:
RIKEN, 2–1 Hirosawa, Wako, Saitama 351–0198, Japan Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, U.K.
Yanna Antypas
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, U.K.
Ryan K.K. Chong
Affiliation:
Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, U.K.
Rafal E. Dunin-Borkowski
Affiliation:
RIKEN, 2–1 Hirosawa, Wako, Saitama 351–0198, Japan Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, U.K.
Get access

Abstract

Two recent developments related to the application of off-axis electron holography to the characterization of magnetic and electrostatic fields in nanoscale materials and devices are described. The first is based on the design and implementation of a three-contact electrical biasing specimen holder that allows electron holograms to be recorded from samples as they are tilted to angles of up to ±70° with voltages applied to them in situ in the electron microscope. The second relates to the prospect of characterizing magnetic vector fields in materials in three dimensions using electron holography.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Dunin-Borkowski, R. E., McCartney, M. R. and Smith, D. J.. In Volume 3 of the Encyclopaedia of Nanoscience and Nanotechnology, ed. Nalwa, H. S. (American Scientific Publishers, 2004) pp. 41–100.Google Scholar
[2] Beleggia, M. and Zhu, Y., Philos. Mag. 83, 1045 (2003).Google Scholar
[3] Midgley, P. A., Weyland, M., Thomas, J. M. and Johnson, B. F. G., Chem. Commun. 10, 907 (2001).Google Scholar
[4] Lai, G. M., Hirayama, T., Fukuhara, A., Ishizuka, K., Tanji, T. and Tonomura, A., J. Appl. Phys. 75, 4593 (1994).Google Scholar
[5] de Graef, M., Nuhfer, N. T. and McCartney, M. R., J. Microsc. 194, 84 (1999).Google Scholar