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Nucleation and Growth at Reactive Interfaces Followed by Impedance Measurements

Published online by Cambridge University Press:  10 February 2011

F. Voiron
Affiliation:
LTPCM, INP Grenoble, 1130 Rue de la piscine 38402 Saint Martin d'Heres, fvoiron@ltpcm.inpg.fr
M. Ignat
Affiliation:
LTPCM, INP Grenoble, 1130 Rue de la piscine 38402 Saint Martin d'Heres, fvoiron@ltpcm.inpg.fr
T. Marieb
Affiliation:
INTEL, Components Research, Santa Clara
H. Fujimoto
Affiliation:
INTEL, Components Research, Santa Clara
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Abstract

To evaluate the thickness of different constitutive layers of a TiAl multilayer, two different experiments, based on impedance measurements on multilayers, have been performed. In the first one, the thickness of the layer is deduced from resistivity measurements, applied to a parallel resistance model. In the second one, the thickness of the layer is deduced from comparing of calculated and measured values of surface potentials.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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