Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Smith, David J.
1989.
Achievement of atomic resolution electron microscopy.
Journal of Electron Microscopy Technique,
Vol. 12,
Issue. 1,
p.
11.
Chen, Y. L.
Carpenter, R. W.
and
Sjoreen, T. P.
1990.
Precipitation in silicon-implanted by oxygen and carbon plus oxygen.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 48,
Issue. 4,
p.
640.
Chabane-Sari, N-E.
Krieger-Kaddour, S.
Vinante, C.
and
Barbier, D.
1992.
Effects of Lamp Pulses on the Oxygen - Precipitation - Gettering of Cr in Czochralski Grown Si.
MRS Proceedings,
Vol. 262,
Issue. ,
Chabane-Sari, N.E
Bouazza, B
and
Barbier, D
2000.
Oxide growth retardation induced by rapid thermal annealing in Czochralsky-grown silicon consequence on the efficiency and the stability of internal gettering of Cr.
Microelectronic Engineering,
Vol. 51-52,
Issue. ,
p.
513.