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Numerical Derivative Analysis of Load-Displacement Curves in Depth-Sensing Indentation

Published online by Cambridge University Press:  01 February 2011

Tom Juliano ,
Vladislav Domnich ,
Tom Buchheit  and
Yury Gogotsi
Tom Juliano
Affiliation:
Department of Materials Science and Engineering Drexel University, Philadelphia, PA 19104, USA
Vladislav Domnich
Affiliation:
Department of Materials Science and Engineering Drexel University, Philadelphia, PA 19104, USA
Tom Buchheit
Affiliation:
Department of Microsystems, Materials, Tribology and Technology - Sandia National Laboratories, Albuquerque, NM 87185, USA
Yury Gogotsi
Affiliation:
Department of Materials Science and Engineering Drexel University, Philadelphia, PA 19104, USA
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Abstract

The use of load-displacement derivative behavior and power-law curve fitting is applied to find the location of events for a number of different materials during depth-sensing indentation. Load-displacement curves for Berkovich indentations on fused silica, fullerene thin film on sapphire, CdTe thin film on silicon, single crystal silicon, carbide derived carbon, and a polymethylmethacrylate/hydroxyapatite (PMMA/HA) particle composite are examined. The analysis is applied to quantify the location of different events that occur during material loading and unloading.

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