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On In-Situ Study of Dislocation/Grain Boundary Interactions Using X-ray Topography and Tem

Published online by Cambridge University Press:  21 February 2011

Ian Baker  and
Fuping Liu
Ian Baker
Affiliation:
Dartmouth College, Thayer School of Engineering, Hanover, New Hampshire 03755, USA
Fuping Liu
Affiliation:
Dartmouth College, Thayer School of Engineering, Hanover, New Hampshire 03755, USA
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Abstract

The advantages and disadvantages of in-situ straining using both synchrotron x-ray topography and transmission electron microscopy for examining dislocation/grain boundary interactions are compared and examples given of the use of each technique. For x-ray topography, studies on ice polycrystals are discussed. Ice is well-suited for x-ray topographic studies since it has both low absorption and can be produced with a low dislocation density. Stress concentrations have been observed at grain boundaries in ice which are partially relieved by generation of 1/3<1120> dislocations. Interestingly, grain boundary generation of dislocations completely overwhelms lattice generation mechanisms. Examples of transmission electron microscope in-situ straining studies include dislocation/grain boundary interactions in L12-structured and B2-structured intermetallics. Slip transmission across grain boundaries by dislocations gliding ahead of an advancing crack is a principal feature of these studies. A significant advantage of the such studies is their inherently high resolution. However, the dislocation behavior is dominated by the inherent thinness of the specimens.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 319: Symposia CB – Defect-Interface Interactions , 1993 , 203
Copyright
Copyright © Materials Research Society 1994

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References

1. Berg, W., Naturwissenschaften 19, 391 (1931).Google Scholar
2. Lang, A.R., J. Appl. Phys. 30, 1748 (1959).CrossRefGoogle Scholar
3. Tanner, B.K., X-ray Diffraction Topography. (Pergamon, Oxford, 1976) a) pp. 1–62; b) p. 59.Google Scholar
4. Liu, F., Baker, I., and Dudley, M., Phil.Mag. A 67, 1261 (1993).Google Scholar
5. Kuriyama, M., Steiner, B.W., and Dobbyn, R.C., Annu. Rev. Mater. Sci. 19, 183 (1989).Google Scholar
6. Tanner, B.K., Safa, M., and Midgley, D., J. Appl. Crystallogr. 10, 91 (1977).CrossRefGoogle Scholar
7. Hondoh, T. and Higashi, A., J. Phys. Chem. 8, 4044 (1983).Google Scholar
8. Thomas, G. and Goringe, M.J., Transmission Electron Microscopy of Materials, (WileyInterscience, New York, 1979), p241.Google Scholar
9. Veyssitre, P., Proc. MRS 133, 175 (1989).Google Scholar
10. Butler, E.P. and Hale, K.F., Dynamic Experiments in the Electron Microscope, North-Holland, Amsterdam, 1981, Ch. 2.Google Scholar
11. Baker, I., Schulson, E.M., and Horton, J.A., Acta Metall. 35, 1533 (1987).Google Scholar
12. McConnell, W.H., Phil. Mag., 33, 863 (1976).Google Scholar
13. Nagpal, P., Baker, I. and Horton, J.A., J. Intermetall., (in press).Google Scholar
14. Baker, I. and Horton, J.A., unpublished research.Google Scholar
15. Lee, T.C., Robertson, I.M. and Birnbaum, H.K., Acta Metall. Mater. 40, 2569 (1992).CrossRefGoogle Scholar
16. Baillin, X., Pelissier, J., Jacques, A., and George, A., Phil. Mag. A 61, 329 (1990).Google Scholar
17. Bond, G.M., Robertson, I.M., and Birnbaum, H.K., J. Mater. Res. 2, 436 (1987).Google Scholar
18. Lee, T.C., Robertson, I.M., and Birnbaum, H.K., Phil. Mag. A 62, 131 (1990).Google Scholar
19. Baker, I., Guha, S., and Horton, J.A., Phil. Mag. A 67, 663 (1993).Google Scholar
20. Fries, E., Dollin, C., Spendel, M., and Castaing, J., Application of X-ray Topogaphic Method to Materials Science, edited by Weissmann, S., Balibar, S. and Petroff, J.F. (Plenum, New York, 1984), p. 359.Google Scholar
21. George, A. and Jourdan, C., Application of X-ray Topographic Method to Materials Science, edited by Weissmann, S., Balibar, S. and Petroff, J.F. (Plenum, New York, 1984), p. 223.Google Scholar
22. Baillin, X., Pelissier, J., J.J., and , Bacmann, Phil Mag. A 55, 143 (1987).CrossRefGoogle Scholar
23. Kajbaji, M.E., Thibault-Desseaux, J., Martinez-Hemandez, M., Jacques, A., and George, A., Rev. Phys. Appl. 22, 569 (1987).Google Scholar
24. George, A., Jacques, A., Michot, G., and Michel, J.P., Application of X-ray Topographic Method to Materials Science, edited by Weissmann, S., Balibar, S. and Petroff, J.F. (Plenum, New Yori, 1984), p. 377.Google Scholar
25. Jacques, A., George, A., Baillin, X., and Bacmann, J.J., Phil. Mag. A. 55, 165 (1987).Google Scholar
26. Benhorma, H.A., Jacques, A., George, A., Baillin, X., Phys. Stat. Sol. (a) 131, 539 (1992).Google Scholar
27. Liu, F. and Baker, I., Meas. Sci. Technol. 4, 416 (1993).Google Scholar
28. Liu, F., Baker, I., and Dudley, M., Phil.Mag. A submitted (1993).Google Scholar
29. Ahmad, S. and Whitworth, R.W., Phil. Mag. A 57, 749 (1988).CrossRefGoogle Scholar
30. Jones, S. J., private communication, (1993).Google Scholar
31. Whitworth, R. W., private communication, (1993).Google Scholar