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On the Formation of Thick and Multiple Layer Simox Structures and their Applications

Published online by Cambridge University Press:  21 February 2011

F. Namavar
Affiliation:
Spire Corporation, Patriots Park, Bedford, MA 01730
E. Cortesi
Affiliation:
Spire Corporation, Patriots Park, Bedford, MA 01730
R. A. Soref
Affiliation:
Rome Air Development Center, Hanscom AFB, MA 01731
P. Sioshansi
Affiliation:
Rome Air Development Center, Hanscom AFB, MA 01731
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Abstract

This paper will address the formation of SIMOX structures with thick and multiple buried SiO2 layers by multiple oxygen implantation and growth of epitaxial Si by chemical vapor deposition (CVD). Our results indicate that SIMOX material can be produced with a buried layer of any thickness or with any number of distinct buried oxide layers and distinct silicon layers. Thick and double buried SiO2 layer material may be useful for high voltage isolation and electric field shielding.

In addition, we have demonstrated optical waveguide action in SIMOX wafers. This suggests that in a double buried SiO2 layer system, three dimensional stacked integration of silicon waveguides is possible, including two level optical interconnects.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

1. Hemment, P.L.F., Reeson, K.J., Kilner, J.A., Chater, R.J., Marsh, C., Booker, G.R., Davis, J.R., and Celler, G.K., Nucl. Instr. and Meth. B 21, 129 (1987).Google Scholar
2. Nakashima, S., Maeda, Y., and Akiya, M., IEEE Trans. Elec. Dev. ED–33, 126 (1986).Google Scholar
3. Soref, R.A. and Lorenzo, J.P., Solid State Technology, Nov, 95 (1988).Google Scholar
4. Cristoloveanu, S., private communication; and Cristoloveanu, S., Proc. Of Int. School on Silicon Technol., in press (1988).Google Scholar
5. Namavar, F. and Cortesi, E., to be published.Google Scholar
6. Lorenzo, J.P. and Soref, R.A., “Method for Fabricating Low-Loss Crystalline Silicon Waveguides by Dielectric Implantation,” U.S. patent 4,789,642, issued December 6, 1988.Google Scholar
7. Soref, R.A. and Lorenzo, J.P., paper MEE-l, presented at the Integrated and Guided-Wave Optics Conference (Optical Society of America), Houston, TX, February 6, 1989.Google Scholar
8. Lorenzo, J.P. and Soref, R.A.. “Electro-Optical Silicon Devices,” U.S. Patent 4,787,691, issued November 29, 1988.Google Scholar
9. Waveguiding in Silicon-on-Insulator has also been observed experimentally by Professor Dennis G. Hall of the University of Rochester, and by Professor Bernard L. Weiss of the University of Surrey, U.K. (private communication, February 1989).Google Scholar