Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-05-16T23:36:32.468Z Has data issue: false hasContentIssue false

Orientation Control of Standing Epitaxial Pentacene Monolayers Using Surface Steps and In-plane Band Dispersion Analysis by Angle Resolved Photoelectron Spectroscopy

Published online by Cambridge University Press:  26 February 2011

Tadamasa Suzuki
Affiliation:
tadamasa@chem.s.u-tokyo.ac.jp, The University of Tokyo, Department of Chemistry, 7-3-1, Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan
Toshihiro Shimada
Affiliation:
shimada@chem.s.u-tokyo.ac.jp, The University of Tokyo, Department of Chemistry, 7-3-1, Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan
Keiji Ueno
Affiliation:
kei@chem.saitama-u.ac.jp, Saitama University, Department of Chemistry, 255, Shimokubo, Sakura-ku, Saitama, 338-8570, Japan
Susumu Ikeda
Affiliation:
ikeda@epi.k.u-tokyo.ac.jp, The University of Tokyo, Department of Complexity Sciences and Engineering, 5-1-5, Kashiwanoha, Kashiwa, 277-8583, Japan
Koichiro Saiki
Affiliation:
saiki@epi.k.u-tokyo.ac.jp, The University of Tokyo, Department of Complexity Sciences and Engineering, 5-1-5, Kashiwanoha, Kashiwa, 277-8583, Japan
Tetsuya Hasegawa
Affiliation:
hasegawa@chem.s.u-tokyo.ac.jp, The University of Tokyo, Department of Chemistry, 7-3-1, Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan
Get access

Abstract

We prepared quasi single crystalline pentacene monolayer films on Bi-terminated Si(111) by using bunched steps on vicinally-cut surfaces as an orientation template. Band dispersion in the conduction plane of pentacene was clearly observed by angle-resolved photoelectron spectroscopy.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Wijs, G. A.de, Mattheus, C. C., Groot, R. A. de and Palstra, T. T. M., Synth. Met. 139, 109 (2003).Google Scholar
2. Hummer, K. and Ambrosch-Draxl, C., Phys. Rev. B 72, 205205 (2005).Google Scholar
3. Hannewald, K. and Bobbert, P.A., Appl. Phys. Lett. 85, 1535 (2004).Google Scholar
4. Coropceanu, V., Malagoli, M., Filho, D. A. da Silva, Gruhn, N.E., Bill, T.G., and Bredas, J. L. Phys. Rev. Lett. 89, 275593 (2002)Google Scholar
5. Fukagawa, H., Yamane, H., Kataoka, T., Kera, S., Nakamura, M., Kudo, K., Ueno, N., Phys. Rev. B 73, 245310 (2006).Google Scholar
6. Yamane, H., Nagamatsu, S., Fukugawa, H., kera, S., Friedlein, R., Okudaira, K.K. and Ueno, N. Phys. Rev. B 72, 153412 (2005).Google Scholar
7. Lukas, S., Sohnchen, S., Witte, G. and Woll, C., ChemPhysChem, 5, 266 (2004).Google Scholar
8. Shimada, T., Nogawa, H., Hasegawa, T., Ueno, K. and Saiki, K., Appl. Phys. Lett. 87, 061917 (2005).Google Scholar
9. Sadowski, J. T., Nagao, T., Yaginuma, S., Fujikawa, Y., Al-Mahboob, A., Nakajima, K., Sakurai, T. Thayer, G. E. and Tromp, R. M., Appl. Phys. Lett. 86, 073109 (2005).Google Scholar
10. Shimada, T., Suzuki, A., Sakurada, T. and Koma, A., Appl. Phys. Lett. 68,2502 (1996).Google Scholar
11. Nakamura, M. and Tokumoto, H., J. Appl. Phys. 89, 7860 (2001).Google Scholar
12. Ikeda, S., Saiki, K., Tsutsui, K., Edura, T., Wada, Y., Miyazoe, H., Terashima, K., Inaba, K., Mitsunaga, T. and Shimada, T., Appl. Phys. Lett. 88, 251905 (2006).Google Scholar
13. Onoki, R., Abe, S., Ueno, K., Nakahara, H. and Saiki, K., Chem. Lett. 35, 746 (2006).Google Scholar
14. Men, F. K., Liu, F., Wang, P.J., Chen, C. H., Cheng, D. L., Lin, J. L. and Himpsel, F. J., Phys. Rev. Lett. 88, 096105 (2002).Google Scholar
15. Wan, K. J., Guo, T., Ford, W. K. and Hermanson, J. C., Surf. Sci. 261, 69 (1992)Google Scholar