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The Origin of Resonance Phenomena in Reflection High-Energy Electron Diffraction

  • S. L. Dudarev (a1) and M. J. Whelan (a1)
Abstract

Resonance scattering of high-energy electrons is responsible for the appearance of bright features observed in reflection high-energy electron diffraction (RHEED) patterns and has found numerous applications in reflection electron microscopy and in RHEED studies of dynamics of molecular beam epitaxial growth of semiconductor crystals. In this paper we report on recent developments in theoretical understanding of the processes leading to resonance reflection of high-energy electrons from a crystal surface.

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MRS Online Proceedings Library (OPL)
  • ISSN: -
  • EISSN: 1946-4274
  • URL: /core/journals/mrs-online-proceedings-library-archive
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