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Oxygen Diffusion in La2−Xsrxcuo4−Y

Published online by Cambridge University Press:  26 February 2011

Elizabeth J. Opila ,
Harry L. Tuller ,
Bernhardt J. Wuensch  and
Joachim Maier
Elizabeth J. Opila
Affiliation:
Crystal Physics and Optical Electronics LaboratoryDepartment of Materials Science and EngineeringMassachusetts Institute of Technology Cambridge, MA 02139
Harry L. Tuller
Affiliation:
Crystal Physics and Optical Electronics LaboratoryDepartment of Materials Science and EngineeringMassachusetts Institute of Technology Cambridge, MA 02139
Bernhardt J. Wuensch
Affiliation:
Crystal Physics and Optical Electronics LaboratoryDepartment of Materials Science and EngineeringMassachusetts Institute of Technology Cambridge, MA 02139
Joachim Maier
Affiliation:
Crystal Physics and Optical Electronics LaboratoryDepartment of Materials Science and EngineeringMassachusetts Institute of Technology Cambridge, MA 02139 also Max Planck Institute for Metal Research Heisenbergstr.5,, Stuttgart 80
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Abstract

Oxygen diffusivities in La2−xSrxCuO4−y (x×0, 0.07, 0.09, 0.12) single crystals were measured using an is 02 exchange technique followed by SIMS profiling. An interstitial diffusion model is proposed to explain the decrease in the oxygen diffusivity with increasing strontium content.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 795
Copyright
Copyright © Materials Research Society 1991

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References

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