Hostname: page-component-848d4c4894-m9kch Total loading time: 0 Render date: 2024-05-16T02:45:49.117Z Has data issue: false hasContentIssue false

Plasma Etching Conditioning of Textured Crystalline Silicon Surfaces for a-Si/c-Si Heterojunctions

Published online by Cambridge University Press:  15 February 2011

R. De Rosa
Affiliation:
ENEA - Research Centre, Localitá Granatello-80055 Portici (Na), Italy
M.L. Addonizio
Affiliation:
ENEA - Research Centre, Localitá Granatello-80055 Portici (Na), Italy
E. Chiacchio
Affiliation:
ENEA - Research Centre, Localitá Granatello-80055 Portici (Na), Italy
F. Roca
Affiliation:
ENEA - Research Centre, Localitá Granatello-80055 Portici (Na), Italy
M. Tucci
Affiliation:
ENEA - Research Centre, Localitá Granatello-80055 Portici (Na), Italy
Get access

Abstract

The development of a hybrid heterojunction fabricated by growing ultrathin amorphous silicon by Plasma Enhanced Chemical Vapor Deposition using temperatures below 250°C offers the potential of obtaining high efficiency solar cells deposited on glassy substrates. The surface preparation represents one of the most critical steps. The first aim of etching is to remove the native oxide layer from the surface of the crystalline wafer, before amorphous layer deposition. The possibility of obtaining this goal with a dry procedure that reduces the exposure of the sample to the environment is not trivial.

We performed several dry etching processes but the best results were obtained using an etching process involving CF4/O2 gases. We have found evidence that plasma etching acts by removing the native oxide and the damaged surface of textured silicon and by leaving an active layer on silicon surface suitable for the emitter deposition. SEM analysis has confirmed that it is possible to find plasma process conditions where no appreciable damage and changes in surface morphology are induced. Detailed investigation was performed to find compatibility and optimization of amorphous layer deposition both on flat and textured cast silicon by changing the plasma process parameters. By using this process we achieved on cast silicon for solar applications photovoltaic conversion efficiencies of 12.9% on 51 cm2 and 9.2% on 45 cm2 active areas for amorphous crystalline heterostructure devices realized on monocrystalline and polycrystalline silicon respectively. We also investigated the compatibility of the process with industrial production of large area devices.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Tanaka, K., Taguchi, M., Takahama, T., Sawada, T., Kuroda, S., Matsuyama, T., Tsuda, S., Takeoka, A., Nakano, S., Hanafusa, H., Kuwano, Y., Progress in Photovoltaics: Research and Applications, 1, p. 85 (1993).Google Scholar
2. Matsuura, H. and Okushi, H., in “Amorphous and Microcrystalline Semiconductor Devices”, Kanicki, Jerzy Editor, 2, p. 517 (1992).Google Scholar
3. Roca, F., Rosa, R. De, Grilli, M.L., Sasikala, G., Tucci, M., Solid State Phenomena. Scitec Publications Ltd, Zug, (1998) in press.Google Scholar
4. Higashi, S., Chabal, Y. J., Trucks, G. W. and Raghavachari, Krishnan, Appl. Phys. Lett. 56, p.656 (1990).Google Scholar
5. Rosa, R. De, Grillo, P., Sinno, G., Roca, F., Tucci, M., 2nd World Conf Exhib. On Photovol. Solar Eenergy Convers Proc. 2, p. 1583 (1998).Google Scholar
6. Shirafuji, T., Stoffels, W.W., Moriguchi, H., Tachibana, K., J Vac Sci Tech. 15, p. 209 (1996).Google Scholar
7. Tucci, M. Solar Energy Materials and Solar Cells, 57, p. 249 (1999).Google Scholar