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Plume and Jetting Regimes in a Laser Based Forward Transfer Process as Observed by Time-Resolved Optical Microscopy

Published online by Cambridge University Press:  17 March 2011

D. Young
Affiliation:
Naval Research Laboratory, Washington DC.
R. C. Y. Auyeung
Affiliation:
Naval Research Laboratory, Washington DC.
A. Piqué
Affiliation:
Naval Research Laboratory, Washington DC.
D. B. Chrisey
Affiliation:
Naval Research Laboratory, Washington DC.
H. Denham
Affiliation:
Superior Micropowders Inc., Albuquerque, NM
Dana D. Dlott
Affiliation:
School of Chemical Sciences, University of Illinois at Champaign-Urbana.
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Abstract

Matrix-Assisted Pulsed Laser Evaporation Direct-Write was investigated by ultra high-speed optical microscopy. A layer of viscous fluid was irradiated with 355nm, 30 ns laser pulses in a laser-forward transfer configuration. The fluid response as a function of fluence was studied, and several distinct regimes of behavior were observed: plume, jetting and sub-threshold. However, the transition between plume and jetting regimes was not readily evident in a study of transfer pixel area vs. fluence, which may be explained by material-substrate interactions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1 DeBoer, C., J. Imag. Sci. Tech., 42 (1998) 6369.Google Scholar
2 Bullock, A. B., Bolton, P. R., J. Appl. Phys., 85 (1999) 460465.Google Scholar
3 Kantor, Z., Toth, Z., Szorenyi, T., Appl. Phys. A., 54 (1992) 170175.Google Scholar
4 Zergioti, I., Mailis, S., Vainos, N. A., Papakonstantinou, P., Kalpouzos, C., Grigoropoulos, C. P., Fotakis, C., Appl. Phys. A, 66 (1998) 579582.Google Scholar
5 Young, D., Wu, H. D., Auyeung, R. C. Y, Modi, R., Fitz-Gerald, J., Pique, A., Chrisey, D. B., Atanassova, P., Kodas, T., J. Mater. Res., 16 (2001) 17201725.Google Scholar
6 Chrisey, D. B., Science, 289, (2000) 879881.Google Scholar
7 Chrisey, D. B., Pique, A., Modi, R., Wu, H. D., Auyeung, R. C. Y., Young, H. D., Chung, R., Appl. Surf. Sci., 6683 (2000) 18.Google Scholar
8 Fitz-Gerald, J. M., Pique, A., Chrisey, D. B., Rack, P. D., Zeleznik, M., Auyeung, R. C. Y., Lakeou, S., Appl. Phys. Lett., 76 (2000) 1386.Google Scholar
9 Nakata, Y., Okada, T., Appl. Phys. Lett. A, 69[Suppl.] (1999) S275–S278.Google Scholar
10 Lee, I.-Y., Tolbert, W. A., Dlott, D. D., Doxtader, M. M., Arnold, D., Foley, D., Ellis, E. R., J. Imag. Sci. Tech. 36 (1992) 180187.Google Scholar
11 Young, D., Auyeung, R. C. Y., Piquè, A., Chrisey, D. B., Appl. Phys. Lett., 78 (2001) 31393171.Google Scholar
12 Hare, D. E., Rhea, S. T., Dlott, D. D., D'Amato, R. J., Lewis, T. E., J. Imag. Sci. Tech., 42 (1998).Google Scholar
13 Koulikov, S. G., Dlott, D. D., J. Imag. Sci. Tech., 44 (2000) 111119.Google Scholar
14 Hare, D. E., Rhea, S. T., Dlott, D. D., D'Amato, R. J., Lewis, T. E., J. Imag. Sci. Tech., 41, (1997).Google Scholar
15 Yildirim, O. E., Basaran, O. A., Chem. Eng. Sci., 56 (2001) 211233.Google Scholar