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Polarization behavior of the exciton-polariton emission of ZnO-based microresonators

Published online by Cambridge University Press:  31 January 2011

Chris Sturm
Affiliation:
csturm@physik.uni-leipzig.de, Universität Leipzig, Institut für Experimentelle Physik II, Leipzig, Germany
Helena Hilmer
Affiliation:
h.hilmer@physik.uni-leipzig, Universität Leipzig, Institut für Experimentelle Physik II, Leipzig, Germany
Rüdiger Schmidt-Grund
Affiliation:
schmidtg@rz.uni-leipzig.de, Universität Leipzig, Institut für Experimentelle Physik II, Leipzig, Germany
Marius Grundmann
Affiliation:
grundmann@physik.uni-leipzig.de, Universität Leipzig, Institut für Experimentelle Physik II, Leipzig, Germany
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Abstract

We present the polarization behavior of the exciton-polariton luminescence of a ZnO-based all-oxide resonator. A splitting in the emission energy between the s- and p-polarized pho-toluminescence of the lower polariton branch was observed which increases with increasing emission angle. It is caused by the polarization behavior of the uncoupled cavity-photon mode, and reaches a maximum of about 5 meV at an emission angle near the bottleneck region. For lar-ger angles the energy splitting decreases. Additionally to the energy splitting, we observed dif-ferences in the photoluminescence intensity which we trace back to different occupation of the lower polariton branch for the two polarizations. Whereas for p-polarization a bottleneck effect is clearly observable, this effect is much weaker for s-polarization. These findings indicate that the relaxation of hot carriers into the bottleneck region is enhanced for the p-polarized photolumi-nescence compared to the s-polarized one. The differences between these two polarizations are most pronounced for a very large negative detuning and vanish with increasing detuning.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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