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Polarization, Interference Contrast, and Photoluminescence Imaging in Near Field Optical Microscopy

Published online by Cambridge University Press:  21 February 2011

M. Vaez-Iravani ,
R. Toledo-Crow  and
J.K. Rogers
M. Vaez-Iravani
Affiliation:
Optical Sciences Group, Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, N.Y. 14623-0887
R. Toledo-Crow
Affiliation:
Optical Sciences Group, Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, N.Y. 14623-0887
J.K. Rogers
Affiliation:
Optical Sciences Group, Center for Imaging Science, Rochester Institute of Technology, P.O. Box 9887, Rochester, N.Y. 14623-0887
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Abstract

The design and operation of a number of techniques in near field optical microscopy are described. Specific attention is paid to the three modalities of polarization, interference contrast, and photoluminescence imaging. By premodulating the polarization state of the sample beam, pure, linear, polarizing microscopy is performed. In addition, polarization anomalies are observed in the focal plane of a high numerical aperture lens. Amplitude and phase contrast imaging is performed in a feedback stabilized Mach-Zehnder interferometer. Magneto-optically induced polarization shifts are detected interferometrically, resulting in linear sensitivity. Localized photoluminescence is induced in porous silicon, and the results are correlated with the topography of the sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 437
Copyright
Copyright © Materials Research Society 1994

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References

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