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Preparation and solid state NMR characterization of phosphonates encapsulated in raw and organically modified SBA-15

Published online by Cambridge University Press:  31 January 2011

Thierry Azais ,
Daniela Aiello ,
Flaviano Testa ,
Guillaume Laurent  and
Florence Babonneau
Thierry Azais
Affiliation:
thierry.azais@upmc.fr, Paris 6 University, Laboratoire Chimie de la Matiere Condensee de Paris, Paris, France
Daniela Aiello
Affiliation:
daniela.aiello@unical.it, University of Calabria, Department of Chemical Engineering and Materials, Arcavacata di Rende, Italy
Flaviano Testa
Affiliation:
f.testa@unical.it, University of Calabria, Department of Chemical Engineering and Materials, Arcavacata di Rende, Italy
Guillaume Laurent
Affiliation:
guillaume.laurent@upmc.fr, Paris 6 University, Laboratoire Chimie de la Matiere Condensee de Paris, Paris, France
Florence Babonneau
Affiliation:
florence.babonneau@upmc.fr, Paris 6 University, Laboratoire Chimie de la Matiere Condensee de Paris, Paris, France
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Abstract

We present in this communication the preparation and the solid state NMR characterization of phenyl phosphonic acid encapsulated both in pure and aminopropyl-modified SBA-15 mesoporous silica materials. The 31P and 1H MAS studies revealed two radically different behaviors of the confined molecules. The included phosphonic acid in SBA-15 is submitted to a confinement effect that implies a weak interaction with the SiO2 surface and a relative mobility at room temperature. On the contrary, phenyl phosphonic acid molecules in the aminopropyl modified sample possess a strong interaction with the hybrid surface of the material. This finding is supported by a two dimensional double-quantum 1H experiment that revealed the close proximity between phenyl phosphonic acid and aminopropyl surface groups.

Keywords

nuclear magnetic resonance (NMR)sol-gelstorage
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1227: Symposium JJ – Multiscale Dynamics in Confining Systems , 2009 , 1227-JJ04-06
Copyright
Copyright © Materials Research Society 2010

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