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Preparation of Multilayered Materials in Cross-Section for in-Situ Tem Tensile Deformation Studies

Published online by Cambridge University Press:  10 February 2011

M. A. Wall  and
T. W. Barbee Jr
M. A. Wall
Affiliation:
L-350, Chemistry & Materials Science Department, Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, CA USA 94550
T. W. Barbee Jr
Affiliation:
L-350, Chemistry & Materials Science Department, Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, CA USA 94550
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Abstract

The success of in-situ transmission electron microscopy experimentation is often dictated by proper specimen preparation. We report here a novel technique permitting the production of crosssectioned tensile specimens of multilayered films for in-situ deformation studies. Of primary importance in the development of this technique is the production of an electron transparent microgauge section using focused ion beam technology. This micro-gauge section predetermines the position at which plastic deformation is initiated; crack nucleation, growth and failure are then subsequently observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 480: Symposium Z – Specimen Preparation for Transmission Electron Microscopy…IV , 1997 , 245
Copyright
Copyright © Materials Research Society 1997

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