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Probing of Ag-based Resistive Switching on the Nanoscale

  • A. Geresdi (a1), A. Halbritter (a1), E. Szilágyi (a2) and G. Mihály (a1)
Abstract
ABSTRACT

We study the switching characteristics of nanoscale junctions between a metallic tip and a silver film covered by a thin Ag2S ionic conductor layer. Resistive switching phenomena are studied on samples of various Ag2S layer thicknesses. Metallic and semiconductor behavior are distinguished by current-voltage characteristics measured at room temperature and at 4.2 K.

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MRS Online Proceedings Library (OPL)
  • ISSN: -
  • EISSN: 1946-4274
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