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Pseudopotential Methods for Superlattices: Applications to Mid-Infrared Semiconductor Lasers

Published online by Cambridge University Press:  10 February 2011

G. C. Dente  and
M. L. Tilton
G. C. Dente
Affiliation:
GCD Associates, Albuquerque, NM 87110, gcdente@gte.net
M. L. Tilton
Affiliation:
Boeing Defense and Space Group, Albuquerque, NM 87106
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Abstract

Calculations of optoelectronic properties for superlattice materials require accurate subband energies, wavefunctions and radiative matrix elements. We have recently begun using a solution method based on the Empirical Pseudopotential Method, or EPM. This method shows particular strength in analyzing structures with short periods or thin layers, for which the standard method, based on k,p perturbation theory and the envelope function approximation, may be problematical. We will describe the EPM applied to bulk solids and then demonstrate our direct generalization of the method for applications to superlattice structures. Finally, we will apply the EPM method to several type II superlattice samples and compare the predictions to absorbance spectroscopy data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 607: Symposium OO – Infrared Applications of Semiconductors III , 1999 , 11
Copyright
Copyright © Materials Research Society 2000

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