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Quantitative X-Ray Microanalysis for the Study of Nanometer-Scale Phases in the Aem

  • Ian M. Anderson (a1) (a2), Jim Bentley (a1) and C. Barry Carter (a2)
Abstract

Secondary excitation can be a large source of inaccuracy in quantitative X-ray microanalysis of inhomogeneous specimens in the AEM. The size of the secondary excitation component in the measured X-ray spectrum is sensitive to the geometry of the thin foil specimen. Secondary excitation has been examined in a self-supporting disc specimen of composition NiO-20 wt.% TiO2 which has been partially masked by a gold slot washer. The ratio of the intensities of the characteristic Kα peaks of Ti and Ni in X-ray spectra from a periclase-structured phase, of nominal composition NiO, has been measured to be NTi / NNi ≈ 0.005. There is no apparent Ti L2,3 signal in the corresponding electron energy-loss spectrum. The secondary excitation contribution to the characteristic Ti Ka-peak from all sources can therefore be no larger than 0.5%. It should be possible to reduce this modest level of secondary excitation still further with a better masking arrangement.

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1. Bentley, J., in Analytical Electron Microscopy - 1981, edited by Geiss, R. H. (San Francisco Press, San Francisco, CA, 1981), pp. 5456.
2. Kenik, E. A. and Bentley, J., in Microbeam Analysis - 1990, edited by Michael, J. R. and Ingram, P. (San Francisco Press, San Francisco, CA, 1990), pp. 289292.
3. Bentley, J., Angelini, P., and Sklad, P. S., in Analytical Electron Microscopy - 1984, edited by Williams, D. B. and Joy, D. C. (San Francisco Press, San Francisco, CA, 1984), pp. 315317.
4. Williams, D. B., Practical Analytical Electron Microscopy in Materials Science (Philips Electronic Instruments, Inc., Mahwah, NJ, 1984).
5. Williams, D. B., Goldstein, J. I., and Fiori, C. E., in Principles of Analytical Electron Microscopy, 2nd ed., edited by Joy, D. C., Romig, A. D. Jr., and Goldstein, J. I. (Plenum Press, New York, 1986).
6. Anderson, I. M., Ph. thesis, D., Cornell University, 1993.
7. Anderson, I. M., Bentley, J., and Carter, C. B., Microbeam Analysis 2, pp. S230–S231 (1993).
8. Anderson, I. M., Bentley, J., and Carter, C. B., in preparation.
9. Muan, A., J. Amer. Ceram. Soc. 75, 13571360 (1992).
10. Spurr, A. R., J. Ultrastr. Res. 26, 3143 (1969).
11. Anderson, I. M., Bentley, J., and Carter, C. B., these proceedings.
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  • ISSN: -
  • EISSN: 1946-4274
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