Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-24T11:09:39.679Z Has data issue: false hasContentIssue false
  • English
  • Français

Scanning Force Microscopy in the Classroom

Published online by Cambridge University Press:  26 February 2011

Fredy Zypman
Fredy Zypman*
Affiliation:
zypman@yu.edu, Yeshiva University, Physics, 2495 Amsterdam Avenue, New York, NY, 10033, United States
Get access

Abstract

We describe a strategy to efficiently introduce concepts of scanning force microscopy in introductory science and engineering classes. Particular emphasis is placed in qualitative understanding via intuition building with numerical trial and error. In addition, model development is introduced and used to perform quantitative predictions of force-separation curves.

Keywords

scanning probe microscopy (SPM)nanoscalestress/strain relationship
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 909: Symposium PP – Forum on Materials Science Education , 2005 , 0909-PP03-16
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Wiesendanger, R., Güntherodt, H.-J., Scanning Tunneling Microscopy III: Theory of STM and Related Scanning Probe Methods, (Springer, Berlin, 1993)Google Scholar
2 Piqueras, J., Zypman, F., Bonnell, D., Shreve, A., Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures, MRS Proc. 738, 2004 Google Scholar
3 Zypman, F., Fast atomic force microscopy, Encyclopedia of nanoscience and nanotechnology, 3, 307 (2004)Google Scholar
4 Sarid, D., Exploring Scanning Probe Microscopy with Mathematica, (Wiley-Interscience, New York, 1997)Google Scholar
5 Zypman, F., Guerra-Vela, C., “The macroscopic scanning force ‘microscope’,” Eur. J. Phys. 22, 17–30 (2001)Google Scholar