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Scanning Tunnelling Microscopy Investigation of Surface Morphology in the Growth of GaAs(001)

Published online by Cambridge University Press:  21 February 2011

E. J. Heller
Affiliation:
University of Wisconsin - Madison, Madison, WI 53706
M. G. Lagally
Affiliation:
University of Wisconsin - Madison, Madison, WI 53706
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Abstract

The surface morphology of MBE - grown GaAs(001) has been investigated using scanning tunnelling microscopy (STM) and reflection high - energy electron diffraction (RHEED). STM shows that the missing - dimer - row structure of the (2 × 4)/c(2 × 8) reconstruction consists of rows of clusters of two As dimers separated by rows of two missing dimers, in agreement with previous reports. Layers grown on nominally flat substrates display a multi - level system of terraces elongated along [110] suggesting that growth occurs primarily by sticking at B - type steps. For films grown under certain growth conditions, B - type steps on vicinal substrates exhibit a dendritic step morphology, which may be an example of a step flow growth instability consistent with limited Ga diffusion over steps.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Burton, W.K., Cabrera, N., and Frank, F.C., Phil. Trans. Roy. Soc. 243, 299(1951).Google Scholar
[2] See, for example, Kinetics of Ordering and Growth at Surfaces, edited by Lagally, M.G., (Plenum Press, New York, 1990).Google Scholar
[3] Cho, A.Y. and Arthur, J.R., Prog. Solid State Chem. 10, 157(1975).Google Scholar
[4] Joyce, B.A., Neave, J.H., Dobson, P.J., and Larsen, P.K., Phys. Rev. B. 22, 814(1984).CrossRefGoogle Scholar
[5] Pukite, P.R., Petrich, G.S., Batra, S., and Cohen, P.I., J. Cryst. Growth 95, 269 (1989).CrossRefGoogle Scholar
[6] Chalmers, S.A., Gossard, A.C., Petroff, P.M., Gaines, J.M., and Kroemer, H., J. Vac. Sci. Technol. B7, 1357(1989).Google Scholar
[7] Neave, J.H., Dobson, P.J., Joyce, B.A., and Zhang, J., Appl. Phys. Lett. 47, 100(1985).Google Scholar
[8] Van Hove, J.M. and Cohen, P.I., J. Cryst. Growth 81, 13(1987).CrossRefGoogle Scholar
[9] Mo, Y.W., Kleiner, J., Webb, M.B., and Lagally, M.G., Phys. Rev. Lett. 66, 1998(1991).Google Scholar
[10] Swartentruber, B.S., Mo, Y.- W., Kariotis, R., Lagally, M.G., and Webb, M.B., Phys. Rev. Lett. 65, 1913(1990).CrossRefGoogle Scholar
[11] Mo, Y.- W., Swartzentruber, B.S., Kariotis, R., Webb, M.B., and Lagally, M.G., Phys. Rev. Lett. 63, 2393(1989).CrossRefGoogle Scholar
[12] Pashley, M.D., Haberem, K.W., Friday, W., Woodall, J.M., and Kirchner, P.D., Phys. Rev. Lett. 60, 2176(1988).Google Scholar
[13] Biegelsen, D.K., Bringans, R.D., Northrup, J.E., and Swartz, L.- E., Phys. Rev. B. 41, 5701(1990).Google Scholar
[14] Pashley, M.D., Haberem, K.W., and Gaines, J.M., Appl. Phys. Lett. 58, 406(1991).CrossRefGoogle Scholar
[15] Kubiak, R.A., Driscoll, P., and Parker, E.H.C., J. Vac. Sci. Technol. 20, 252(1982).Google Scholar
[16] Pashley, M.D., Phys. Rev. B. 40, 10481(1989).Google Scholar
[17] Kariotis, R. and Lagally, M.G., Surface Sci. 216, 557(1989).Google Scholar
[18] Lagally, M.G., Mo, Y.- W., Kariotis, R., Swartzentruber, B.S., and Webb, M.B., in Kinetics of Ordering and Growth at Surfaces, edited by Lagally, M.G. (Plenum Press, New York, 1990) pp. 145 - 168.Google Scholar
[19] Recent RHEED results suggest a similar conclusion, see Joyce, B.A., ASCI Conf. Proceedings, Appl. Surface Sci., to be published.Google Scholar
[20] Wang, S.C. and Ehrlich, G., Phys. Rev. Lett. 67, 2509(1991).Google Scholar
[21] Phang, Y.H., Savage, D.E., Kuech, T.F., and Lagally, M.G., Appl. Phys. Lett., submitted.Google Scholar
[22] Bales, G.S. and Zangwill, A., Phys. Rev. B. 41, 5500(1990).Google Scholar