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Segregation of Yttrium at Grain Boundaries in α-Al2O3

Published online by Cambridge University Press:  21 March 2011

Stefan Nufer ,
Wolfgang Kurtz  and
Manfred Rühle
Stefan Nufer
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
Wolfgang Kurtz
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
Manfred Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
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Abstract

Quantitative X-ray analysis allows the investigation of yttrium-doped grain boundaries. In the present study well-defined bicrystal interfaces were characterized. The quantitative comparison of segregation at different bicrystals requires a correction of artifacts in the X-ray spectra due to mass absorption, fluorescence, and beam spread. Mean grain boundary excess values of 3 Y/nm2 and around 5 Y/nm2 were found at a ∑17 and ∑37 symmetrical grain boundary, respectively. Additionally, with the ∑17 bicrystal YAG precipitation and presence of silicon was found.

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