Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-14T13:26:08.265Z Has data issue: false hasContentIssue false

Segregation Phenomenon and Electrical Properties of Yttria Stabilized Zirconia Ceramics by the Addition of La2O3

Published online by Cambridge University Press:  26 February 2011

Young-Jei Oh
Affiliation:
Korea Advanced Institute of Science and Technology, P.O.Box131, Cheongryang, Seoul, Korea
Hyung-Jin Jung
Affiliation:
Korea Advanced Institute of Science and Technology, P.O.Box131, Cheongryang, Seoul, Korea
Hee-Soo Lee
Affiliation:
Dept.of Ceramic Engineering, Yonsei Univ., Seoul, Korea
Get access

Abstract

The influence on electrical properties of yttria-fully-stabilized zirconia with low contents of lanthana (up to 5 mol%) were studied. Phase transformation by XRD, lattice parameter, crystallite size, and chemical composition after 4h sintering at 1400°C were adopted for the characterization of the synthesized solid electrolyte. Electrical conductivity from 350°C to 800°C and frequency dependence by complex impedance method were measured to analyze the role of grain-bulk and grain boundary on the electrical conductivity respectively. Nicrostructures of the synthesized sample were observed by SEM(EDS) and TEM for the confirmation of segregation phenomena at grain boundary. Sinterability was improved in the limited amount of La2O3 addition up to 0.5 mol%. The electrical conductivity decreased with increasing the La2O3 addition overall, but slightly increased up to 1 mol% due to the substitution of La3+ for Zr4+. The overall electrical conductivity was much dependent on the contribution of grain-bulk. However, both the potential barrier in the lower La2O3 contents and segregation of second phases in the higher La2O3 contents influenced the electrical conductivity.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCE

1. Badwal, S.P.S., J. Mat. Sci. 19, 1767 1984.CrossRefGoogle Scholar
2. Wilhelm, R.V. and Howarth, D.S., Am. Ceram. Soc. Bull. 58, 228 1979.Google Scholar
3. Verkerk, M.J., Winnubst, A.J.A. and Burggraaf, A.J., J. Mat. Sci. 17, 3113 1982.CrossRefGoogle Scholar
4. Keizer, K., Burggraaf, A.J. and DeWith, G., J. Mat. Sci. 17, 1095 1982.CrossRefGoogle Scholar
5. Inozemtsev, M.V. and Perfil'eV, M.V., Eng. Transl. of Electrokhimiya, 1031 (1975) [Sow. Elctrochem. 11, 951 (1975)].Google Scholar
6. Miyayama, M., Yanagida, H. and Asada, A., Am. Ceram, Soc. Bull. 64, 660 1985.Google Scholar
7. Oh, Y.J., Jung, H.J. and Lee, H.S., to be publishedGoogle Scholar
8. Klug, H.P. and Alexander, L.E., X-ray Diffraction Procedures, (John Wiley & Sons, 1954), Ch.9.Google Scholar
9. Bauerle, J.E., J. Phys. Chem. Solids, 30, 2657 1969.CrossRefGoogle Scholar
10. Verkerk, N.J., Middelhuis, B.J. and Burggraaf, A.J., solid State Ionics, 6, 159 1982.CrossRefGoogle Scholar