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Semiconductor Detectors Fabricated from TlBr Crystals

Published online by Cambridge University Press:  13 July 2011

Keitaro Hitomi ,
Tsutomu Tada ,
Seong-Yun Kim ,
Yan Wu ,
Hiromichi Yamazaki ,
Tadayoshi Shoji  and
Keizo Ishii
Keitaro Hitomi
Affiliation:
Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan
Tsutomu Tada
Affiliation:
Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan
Seong-Yun Kim
Affiliation:
Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan
Yan Wu
Affiliation:
Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan
Hiromichi Yamazaki
Affiliation:
Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan
Tadayoshi Shoji
Affiliation:
Department of Electronics and Intelligent Systems, Tohoku Institute of Technology, Sendai 982-8577, Japan
Keizo Ishii
Affiliation:
Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
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Abstract

Frisch collar detectors were fabricated from TlBr crystals with the dimensions of 2 mm × 2 mm × 4.4 mm. Spectroscopic performance of the TlBr Frisch collar detectors was evaluated at room temperature. An energy resolution of 2.9% FWHM at 662 keV was obtained from the detector without the depth correction. The detector exhibited stable spectral performance for 12 hours. Direct measurements of electron mobility-lifetime products were performed with the detectors. The TlBr crystals exhibited the electron mobility-lifetime products of ∼10−3 cm2/V at room temperature.

Keywords

crystal growthzone meltingsensor
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1341: Symposium U – Nuclear Radiation Detection Materials , 2011 , mrss11-1341-u10-03
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Hitomi, K., Murayama, T., Shoji, T., Suehiro, T., and Hiratate, Y., Nucl. Instrum. Meth. A428, 372 (1999).Google Scholar
2. Hitomi, K., Onodera, T., and Shoji, T., Nucl. Instrum. Meth. A579, 153 (2007).Google Scholar
3. Shah, K.S., Lund, J.C., Olschner, F., Moy, L., and Squillante, M.R., IEEE Trans. Nucl. Sci. 36, 199 (1989).Google Scholar
4. Gostilo, V., Owens, A., Bavdaz, M., Lisjutin, I., Peacock, A., Sipila, H., and Zatoloka, S., Nucl. Instrum. Meth. A509, 47 (2003).Google Scholar
5. Owens, A., Bavdaz, M., Brammertz, G., Gostilo, V., Haack, N., Kozorezov, A., Lisjutin, I., Peacock, A., and Zatoloka, S., Nucl. Instrum. Meth. A497, 359 (2003).Google Scholar
6. Kozlov, V., Kemell, M., Vehkamäki, M., and Leskelä, M., Nucl. Instrum. Meth. A576, 10 (2007).Google Scholar
7. Churilov, A.V., Ciampi, G., Kim, H., Cirignano, L.J., Higgins, W.M., Olschner, F., and Shah, K.S., IEEE Trans. Nucl. Sci. 56, 1875 (2009).Google Scholar
8. Kim, H., Churilov, A., Ciampi, G., Cirignano, L., Higgins, W., Kim, S., O’Dougherty, P., Olschner, F., and Shah, K., Nucl. Instrum. Meth. A629, 192 (2011).Google Scholar
9. Barrett, H.H., Eskin, J.D., and Barber, H.B., Phys. Rev. Lett. 75, 156 (1995).Google Scholar
10. Hitomi, K., Onodera, T., Shoji, T., Hiratate, Y., and He, Z., IEEE Trans. Nucl. Sci. 55, 1781 (2008).Google Scholar
11. McNeil, W. J., McGregor, D. S., Bolotnikov, A. E., Wright, G. W., and James, R. B., Appl. Phys. Lett. 84, 1988 (2004).Google Scholar
12. Kargar, A., Jones, A. M., McNeil, W. J., Harrison, M. J., and McGregor, D. S., Nucl. Instrum. Meth. A558, 497 (2006).Google Scholar
13. Bolotnikov, A. E., Baker, J., DeVito, R., Sandoval, J., and Szurbart, L., IEEE Trans. Nucl. Sci. 52, 468 (2005).Google Scholar
14. Ariesanti, E., Kargar, A., and McGregor, D.S., Nucl. Instrum. Meth. A624, 656 (2010).Google Scholar
15. Kim, H., Cirignano, L., Churilov, A., Ciampi, G., Kargar, A., Higgins, W., O’Dougherty, P., Kim, S., Squillante, M. R., and Shah, K., Proc. SPIE 7806, 780604 (2010).Google Scholar
16. Hitomi, K., Shoji, T., and Niizeki, Y., Nucl. Instrum. Meth. A585, 102 (2008).Google Scholar
17. Hitomi, K., Kikuchi, Y., Shoji, T., and Ishii, K., IEEE Trans. Nucl. Sci. 56, 1859 (2009).Google Scholar
18. He, Z., Knoll, G.F., Wehe, D.K., Rojeski, R., Mastrangelo, C.H., Hammig, M., Barrett, C., and Uritani, A., Nucl. Instrum. Meth. A380, 228 (1996).Google Scholar
19. He, Z., Knoll, G.F., and Wehe, D.K., J. Appl. Phys. 84, 5566 (1998).Google Scholar