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A Soft Lithographic Approach to the Fabrication of Single Crystalline Silicon Nanostructures with Well-Defined Dimensions and Shapes

Published online by Cambridge University Press:  17 March 2011

Yadong Yin
Affiliation:
Department of Materials Science and Engineering
Byron Gates
Affiliation:
Department of Chemistry, University of Washington, Seattle, WA 98195 (USA)
Younan Xia
Affiliation:
Department of Chemistry, University of Washington, Seattle, WA 98195 (USA)
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Abstract

A procedure was developed for large-scale fabrication of nanometer-sized structures of single crystalline silicon with well-defined dimensions and shapes. Near-field optical lithography was used to define the nanostructures in a thin film of positive-tone photoresist with an elastomeric phase mask. The nanostructures were then transferred into the underlying silicon-on-insulator (SOI) substrate through a reactive ion etching (RIE) process. With this method, we can routinely generate silicon nanostructures ∼130 nm in lateral dimension. They can be supported on the surface of a solid substrate as a patterned array, or released into a freestanding form. The lateral dimension of these silicon structures could be further reduced to as small as ∼40 nm using stress-limited oxidation at elevated temperatures. The flexibility of this approach was demonstrated by fabricating nanoscale wires, rods, rings, and interconnected triangles of silicon. Using a two-step exposure method, the silicon nanowires can be precisely “cut” into silicon nanorods with specific lengths.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

[1] Prokes, S. M., Wang, K. L., a special issue in MRS Bull., 24, 13 (1999).Google Scholar
[2] Hu, J., Odom, T. W., Lieber, C. M., Acc. Chem. Res., 32, 435 (1999).Google Scholar
[3] a)Wagner, R. S., Ellis, W. C., Appl. Phys. Lett., 4, 89 (1964). b) E. I. Givargizov, J. Vac. Sci. Technol. B, 11, 449 (1993). c) A. M. Morales, C. M. Lieber, Science, 279, 208 (1998). d) H. Z. Zhang, D. P. Yu, Y. Ding, Z. G. Bai, Q. L. Hang, S. Q. Feng, Appl. Phys. Lett., 73, 3396 (1998). e) N. Wang, Y. F. Zhang, Y. H. Tang, C. S. Lee, S. T. Lee, Appl. Phys. Lett., 73, 3902 (1998).Google Scholar
[4] a)Lyding, J. W., Shen, T. C., Hubacek, J. S., Tucker, J. R., Abein, G. C., Appl. Phys. Lett., 64, 2010 (1994). b)A. C. F. Hoole, M. E. Welland, A. N. Broers, Semicond. Sci.Technol., 12, 116 (1997). c) A. C. Irvine, Z. A. K. Durrani, H. Ahmed, Appl. Phys. Lett., 73, 1113 (1998). d) S. Hu, A. Hamidi, S. Altmeyer, T. Koster, B. Spangenberg, H. Kurz, J. Vac. Sci. Technol. B, 16, 2822 (1998).Google Scholar
[5] Xia, Y., Rogers, J. A., Paul, K. E., Whitesides, G. M., Chem. Rev., 99, 1823 (1999).Google Scholar
[6] a)Rogers, J. A., Paul, K. E., Jackman, R. J., Whitesides, G. M., Appl. Phys. Lett., 70, 2658 (1997). b) J. Aizengerg, J. A. Rogers, K. E. Paul, G. M. Whitesides, Appl. Opt., 37, 2145 (1998). c) H. Schmid, H. Biebuyck, B. Michel, O. J. F. Martin, Appl. Phys. Lett., 72, 2379 (1998).Google Scholar
[7] Colinge, J. P., MRS Bull., 23(12), 16 (1998).Google Scholar
[8] a)Legtenberg, R., Jansen, H., Boer, M. de, Elwenspoek, M., J. Electrochem. Soc., 142, 2020 (1995). b) S. Verhaverbeke, I. Teerlinck, C. Vinckier, G. Stevens, R. Cartuyvels, M. M. Heyns, J. Electrochem. Soc., 141, 2852 (1994).Google Scholar
[9] a)Kurihara, K., Iwadate, K., Namatsu, H., Nagase, M., Murase, K., J. Vac. Sci. Technol. B, 13, 2170 (1995). b) M. Gotza, M. Dutoit, M. Ilegems, J. Vac. Sci. Technol. B, 16, 582 (1998). c) J. Kedzierski, J. Bokor, C. Kisielowski, J. Vac. Sci. Technol. B, 15, 2825 (1997). d) L. Guo, P. R. Krauss, S. Y. Chou, Appl. Phys. Lett., 71, 1881 (1997).Google Scholar
[10] a)Liu, H., Biegelsen, D. K., Ponce, F. A., Johnson, N. M., Pease, R. F. W., Appl. Phys. Lett., 64, 1383 (1994).Google Scholar