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Solid-State Reactions in Multilayer Ni/Ti Thin Film Composites

Published online by Cambridge University Press:  26 February 2011

Gillian E. Winters
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, DE 197X6
K.M. Unruh
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, DE 197X6
C.P. Swann
Affiliation:
Department of Physics and Astronomy/Barto1 Research Institute, University of Delaware, Newark, DE 19716
M.E. Patt
Affiliation:
Department of Physics and Astronomy/Barto1 Research Institute, University of Delaware, Newark, DE 19716
B.E. White
Affiliation:
Department of Physics, Applied Physics, and Astronomy, State University of New York at Binghamton, Binghamton, NY 13901
E.J. Cotts
Affiliation:
Department of Physics, Applied Physics, and Astronomy, State University of New York at Binghamton, Binghamton, NY 13901
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Abstract

Multilayer films, consisting of alternating layers of crystalline Ni and Ti, have been prepared by RF sputter deposition over a range of modulation wavelengths corresponding to an overall composition of Ni50Ti50. These films have been characterized by xray diffraction and Rutherford backscattering measurements. The solid-state transformation by interdiffusional mixing of the individual layers has been directly studied by differential scanning calorimetry and correlated with structural measurements. These measurements indicate that the solid-state reaction of Ni and Ti multilayers proceeds through the formation of a metastable solid solution of Ti in Ni followed by the formation of intermetallic equilibrium compounds. No direct calorimetric or structural evidence for the formation of an amorphous Ni-Ti phase has been found in these samples.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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