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Some Possibilities of using Defects for Applications in Semiconductors

Published online by Cambridge University Press:  03 September 2012

Michel Lannoo
Michel Lannoo*
Affiliation:
I. E. M. N. (UMR CNRS No 9929), Département ISEN, 41, boulevard Vauban, 59046 LILLE CEDEX
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Abstract

Specific situations where defects have a positive impact on the properties of semiconductors are examined. In a first category are ranged defects used as probes for characterizing materials. Then semiconductors with high concentration of defects like low temperature GaAs and porous Si are discussed. This is followed by cases where direct use is made of the defect properties (optical, pressure…). Finally several possibilities for defect engineering of materials are reviewed.

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References

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