Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-06T10:07:13.640Z Has data issue: false hasContentIssue false
  • English
  • Français

Some Unusual Properties of the Fine Structure of Dislocations in Ni3Al Deformed at High Temperature

Published online by Cambridge University Press:  22 February 2011

Patrick Veyssiére  and
J. A. Horton
Patrick Veyssiére
Affiliation:
LEM, CNRS-ONERA, BP 72, 92322 Chatillon Cedex, France
J. A. Horton
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
Get access

Abstract

In Ni3Al polycrystals deformed at 850°C and quenched rapidly, surface defects exhibit two kinds of behaviour. On the one hand, dislocation coupling by antiphase boundary (APB) and complex stacking fault (CSF) is of normal magnitude for this alloy composition. On the other hand, separations are dramatically decreased in both cases. A method to visualize antiphase boundaries using a weakly excited superlattice reflection is introduced.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 364: Symposium L – High-Temperature Ordered Intermetallic Alloys–VI , 1994 , 339
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Hemker, K.J. and Mills, M.J., Phil. Mag. A, 68, 305 (1993).Google Scholar
[2] Mills, M.J., Baluc, N. and Karnthaler, H.P., MRS Proceedings, 133 (1993), p. 203.Google Scholar
[3] Crimp, M.A., and Hazzledine, P.M., MRS Proceedings, 132 (1993), p. 131.Google Scholar
[4] Baluc, N., Karnthaler, H.P. and Mills, M.J., in EUREM 88, 93 (Inst. Phys. Conf. Sen, 1988), p. 463.Google Scholar
[5] Liu, Y., Takasugi, T., Izumi, O. and Ohta, H., Phil. Mag. Letters, 58, 81 (1988).Google Scholar
[6] Veyssière, P., Horton, J.A.., Yoo, M.H. and Liu, C.T., Phil. Mag. Letters, 57, 17 (1988).Google Scholar
[7] Bontemps-Neveu, C., These de Doctorat, Université de Paris-Sud, (1991).Google Scholar
[8] Edington, J.W., in Practical Electron Microscopy in Materials Science, Philips Techn. Library, (Macmillan, London, 1975), vol. 3, p. 20. and vol. 4, p. 37.Google Scholar
[9] Veyssière, P. and Morris, D., Phil. Mag. Letters, 67, 491 (1988).Google Scholar
[10] Vanderschaeve, G., Phil. Mag. A, 56, 689 (1987).Google Scholar
[11] Sun, Y.Q., Crimp, M.A., Hazzledine, P.M. and Couret, A., Phil. Mag. A, 64, 311 (1991).Google Scholar
[12] Calvayrac, S. and Fayard, M., Acta metall., 14, 783 (1966).Google Scholar
[13] Horton, J.A. and Liu, C.T., Acta metall., 33, 2191 (1985).Google Scholar
[14] Lasalmonie, A., Chenal, B., Hug, G. and Beauchamp, P., Phil. Mag. A, 58, 543 (1988).Google Scholar
[15] Veyssière, P. and Westmacott, K.H., 53, 563 (1986).Google Scholar
[16] Douin, J. and Veyssière, P., Phil. Mag. A, 64, 807 (1991).Google Scholar
[17] Chou, C.T., Hirsch, P.B., McLean, M. and Hondros, E., Nature, 300, 621 (1982).Google Scholar
[18] Sun, Y.Q., Phil. Mag. A, 65, 287 (1992).Google Scholar
[19] Veyssière, P. and Horton, J.A., in preparation.Google Scholar