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Strained Field of Silver Overlayers Deposited on the Reconstructed Si(111) Surface

Published online by Cambridge University Press:  25 February 2011

L. J. Martinez-Miranda ,
J. J. Santiago-Aviles ,
Raul Perez-Sandoz ,
Randolph Carolissen ,
H. H. Weitering  and
W. R. Graham
L. J. Martinez-Miranda
Affiliation:
Department of Electrical Engineering, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
J. J. Santiago-Aviles
Affiliation:
Department of Electrical Engineering, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Raul Perez-Sandoz
Affiliation:
Department of Physics, University of Puerto Rico, Cayey, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Randolph Carolissen
Affiliation:
Department of Materials Science and Engineering, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
H. H. Weitering
Affiliation:
Department of Materials Science and Engineering, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
W. R. Graham
Affiliation:
Department of Materials Science and Engineering, Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
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Abstract

We have performed high resolution x-ray diffraction measurements of the strain field in UHV deposited Ag(111) films on a 7×7 reconstructed Si(111) surfaces shows a faulted epitaxial layer with a 0.4% out-of-plane strain, and a -1% in-plane strain. The strain field anisotropy is similar to that observed on epitaxial YSi2-x on Si(111), and is an unexpected result for the present system, due to the lack of a lattice match between the silver and silicon unit cells. The out-of-plane diffraction peaks have an angular distribution of 1.23°, full width at half maximum (FWHM), as determined from rocking curve measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 407
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Tung, R. T., Phys. Rev. Lett. 52, 461 (1984).CrossRefGoogle Scholar
2. Tung, R. T., Levi, A.F.J., Sullivan, J.P. and Schrey, F., Phys. Rev. Lett. 66, 72 (1991).CrossRefGoogle Scholar
3. Heslinga, D.R., Weitering, H. H., van der Werf, D. P., Klapwijk, T. M. and Hibma, T., Phys. Rev. Lett., 64, 1589 (1990);CrossRefGoogle Scholar
Weitering, H. H., Mat. Sci. and Eng., B14, 281 (1992).CrossRefGoogle Scholar
4. Weitering, H. H. et al., to appear in Appl. Surf. Sci.Google Scholar
5. Park, K.-H., Smith, G. A., Rajan, K. and Wang, G.-C., Mett. Trans. A, 21A, 2323 (1990).CrossRefGoogle Scholar
6. Wong, H., Aburano, R. D., Lin, D.-S., Chen, Haydn, Chiang, T.-C., Zschack, P. and Specht, E. D., Phys. Rev. Lett. 68, 507 (1991).Google Scholar
7. Warren, B. E., X-rav Diffraction. Addison-Wesley Pub. Co., 1969, chapter 13.Google Scholar
8. Martínez-Miranda, L.J., Siegal, M.P., Heiney, P.A., Santiago-Avilés, J.J. and Graham, W.R., in Mat. Res. Soc. Symp. Proc., 180, 287 (1990);Google Scholar
Martínez-Miranda, L.J., Siegal, M. P., Heiney, P.A., Santiago-Avilés, J.J. and Graham, W.R., submitted to J. Mater. Res.Google Scholar