Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-20T05:27:58.900Z Has data issue: false hasContentIssue false

Stress-Corrosion Cracking of Spin-on Glass Thin Films

Published online by Cambridge University Press:  10 February 2011

Robert F Cook
Affiliation:
IBM Research, Yorktown Heights, NY 10598
Eric G Liniger
Affiliation:
IBM Research, Yorktown Heights, NY 10598
Get access

Abstract

The crack-velocity behavior of silsesqioxane spin-on glass thin films exposed to moist environments is examined. An absolute reaction-rate model is used to predict crack velocity using a deleted-bond model and fused silica as a basis, and compared with observed steady-state crack velocities as a function of film thickness and variations in the curing process. An implication is that, on curing, the driving force for film fracture, determined by thermal expansion mismatch, increases less rapidly than the fracture resistance, determined by polymerization.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Baney, R. H. itoh, M. Sakakibara, A. and Suzuki, T. Chem. Rev. 95, p. 1409 (1995).Google Scholar
2. Miller, R. D. Hedrick, J. L., Yoon, D. Y. Cook, R. F. and Hummel, J. P., MIS Bulletin 22, p. 44 (1997).Google Scholar
3. Cook, R. F. Liniger, E. G. Klaus, D. P. Simonyi, E. E. and Cohen, S. A. in Low Dielectric Constant Materials and Applications in Microelectronics IV (this volume).Google Scholar
4. Wiederhorn, S. M. and Bolz, L. H. J. Am. Ceram. Soc. 53, p. 543 (1970).Google Scholar
5. Cook, R. F. and Liniger, E. G. J. Amer. Cer. Soc. 76, p. 10 96 (1993).Google Scholar
6. Cook, R.F. Mater. Sci. Eng., in press (1998)Google Scholar