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Surface Diffusion: Atomistics and Surface Morphology (Summary of MRS Symposium B Panel Discussion)

Published online by Cambridge University Press:  25 February 2011

M. H. Grabow ,
P. J. Feibelman ,
G. H. Gilmer ,
B. H. Cooper  and
Y. W. Mo
M. H. Grabow
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
P. J. Feibelman
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
G. H. Gilmer
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
B. H. Cooper
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853
Y. W. Mo
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
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Abstract

This paper gives some of the highlights of a panel discussion on surface diffusion held Monday, November 30, 1992 at the Fall MRS Meeting in Boston, Massachusetts. Four invited speakers discussed computer modeling techniques and scanning tunneling microscopy experiments that have been used to provide new understanding of the atomistic processes that occur at surfaces. We present a summary of each of the invited talks, indicate other presentations on surface diffusion in this proceedings, and provide a transcript of the two discussion sessions.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 11
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. The Theory of the Inhomogeneous Electron Gas, eds. Lundqvist, S. and March, N. H. (Plenum Press, New York, 1983).Google Scholar
2. Feibelman, P. J., this volume, p. 31.Google Scholar
3. Brocks, G., Kelly, P. J., and Car, R., Phys. Rev. Lett. 66, 1729 (1991).Google Scholar
4. Mo, Y.W. and Lagally, M.G., Surf. Sci. 248, 313 (1991);Google Scholar
Mo, Y.W. Kleiner, J., Webb, M.B., and Lagally, M.G., Phys. Rev. Lett. 66, 1998 (1991).Google Scholar
5. Roland, C. and Gilmer, G. H., Phys. Rev. Lett. 67, 3188 (1991).Google Scholar
6. Wang, and Rockett, , Phys. Rev. B43, 12571 (1991).Google Scholar
7. Roland, C. and Gilmer, G. H., Phys. Rev. B46, 13428, (1992);CrossRefGoogle Scholar
Roland, C. and Gilmer, G. H., Phys. Rev. B46, 13437, (1992).Google Scholar
8. Cooper, B. H., Peale, D. R., McLean, J. G., Phillips, R., and Chason, E., this volume, p. 37.Google Scholar
9. Mo, Y. W., in preparation.Google Scholar
10. Mo, Y.W., Phys. Rev. Lett. 69, 3643 (1992).Google Scholar
11. From this volume: Tringides, M. C., p. 47;Google Scholar
Metcalfe, F. L. and Venables, J. A., p. 55;Google Scholar
Ladna, B. and Birnbaum, H. K., p. 59;Google Scholar
Golovchenko, J., Hwang, I.-S., Ganz, E., and Theiss, S., p. 79;Google Scholar
Tsong, T. T., p. 87 Google Scholar
Tanishiro, Y. and Yagi, K., p. 109.Google Scholar
12. Tien Tsong, T., this volume, p. 87;Google Scholar
Chen, C. L. and Tsong, T. T., to be published.Google Scholar
13. Jones, G. W., Marcano, J. M., Norskov, J., and Venables, J. A., Phys. Rev. Lett. 65, 3317 (1990).Google Scholar
14. Venables, J. A., Drucker, J. S., and Raynerd, G., MRS Symp. Proc. 263, 3 (1992);Google Scholar
Raynerd, G., Doust, T. N., and Venables, J. A., Surf. Sci. 261, 251 (1992).Google Scholar
15. Kellogg, G. L. and Voter, A. F., Phys. Rev. Lett. 67, 622 (1991).Google Scholar
16. Velfe, H. D., Stenzel, H., and Krohn, M., Thin Solid Films 98, 115 (1982); see also reviews, e.g. by Robins, Venables, Bethge, etc. in various places.Google Scholar
17. Michely, T. and Comsa, G., Surface Science 256, 217 (1991).Google Scholar
18. Srivastava, D. and Garrison, B. J., Phys. Rev. B46, 1472 (1992).Google Scholar
19. Casanova, R. and Tsong, T. T., Thin Solid Films, 93, 41 (1982).Google Scholar
20. Golovchenko, J., Hwang, I.-S., Ganz, E., and Theiss, S. K., this volume, p. 79;Google Scholar
Ganz, E., Theiss, S. K., Hwang, I.-S., Golovchenko, J., Phys. Rev. Lett. 68, 1567 (1992).Google Scholar
21. Useful papers by Gomer, R., Bonzel, H., Bassett, D. W., Wagner, H., et al., in Surface Mobilities on Solid Materials ed. Binh, V. T., NATO-AS1 B86, Plenum Press (1983);Google Scholar
See also Gomer, R., Repts. Prog. Phys. 53, 917 (1990);Google Scholar
Ehrlich, G., Scanning Microscopy 4, 829 (1990).Google Scholar
22. Naumovets, A. G. and Vedula, Y. S., Surf. Sci. Reports 4, 365 (1985);Google Scholar
Lyuksyutov, I., Naumovets, A. G. and Pokrovsky, V., Two-dimensional crystals, Academic Press (1992).Google Scholar
23. Tsong, T. T., Repts. Prog. Phys. 51, 759 (1988).Google Scholar