Hostname: page-component-7c8c6479df-nwzlb Total loading time: 0 Render date: 2024-03-28T05:25:44.291Z Has data issue: false hasContentIssue false

Surface Potential Mapping of Patterned Self-Assembled Monolayers by Scanning Probe Microscopy

Published online by Cambridge University Press:  01 February 2011

R. Ross Getty
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Rodolfo Alvarez
Affiliation:
Dept. of Materials Science & Engineering, University of Pennsylvania, Philadelphia, PA, USA
Dawn A. Bonnell
Affiliation:
Dept. of Materials Science & Engineering, University of Pennsylvania, Philadelphia, PA, USA
Kenneth G. Sharp
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Simona Percec
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Paula B. Hietpas
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Get access

Abstract

Surface potentials of a number of patterned conducting and insulating self-assembled monolayers (SAMs) were measured by scanning surface potential microscopy (SSPM) as part of a study in molecular electronics. Differences in surface potential were measured for insulating and conducting molecule SAMs on gold. The SAMs were patterned by microcontact printing. High contrast patterns were observed by surface potential even when little imaging was possible in standard AFM modes. Surface potential differences of a few mV to 500 mV were observed under ambient conditions between adjacent SAMs of different compositions or between SAMs and the unmodified substrate.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Schön, J.H., Meng, H., Bao, Z., Nature 413, 713, (2001).Google Scholar
2. Schön, J.H., Meng, H., Z. Bao, Science, 294, 2138, (2001).Google Scholar
3. Xia, Y., Whitesides, G. M., Annu. Rev. Mater. Sci., 28, 153, (1998).Google Scholar
4. Yan, L., Zhao, X.M., Whitesides, G. M., J Am. Chem. Soc., 120, 6179, (1998).Google Scholar
5. Digital Instruments manual on Nanoscope III (2002)Google Scholar
6. Motomatsu, M., Mizutani, W., Nie, H.Y, Tokumoto, H., Thin Solid Films, 281-282, 548, (1996).Google Scholar
7. , J., Delamarche, E., Eng, L., Benewitz, R.. Meyer, E., Güntherodt, H.J., Langmuir, 15, 8184, (1999).Google Scholar
8. Campbell, I. H., Rubin, S., Zawodzinski, T. A., Kress, J. D., Martin, R. L., Smith, D. L., Barashkov, N. N., and Ferraris, J. P., Phys. Rev. B 54, 14321, (1996).Google Scholar
9. Dhirani, A., Lin, P.H., Guyot-Sionnest, P., J. Chem. Phys. 106, 5249, (1997).Google Scholar