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Surface Segregation in Multicomponent Clusters

Published online by Cambridge University Press:  26 February 2011

Peter A. Dowben ,
Ning Wu ,
Natalie Palina ,
Hartwig Modrow ,
Robert Müller ,
Josef Hormes  and
Yaroslav B. Losovyj
Peter A. Dowben
Affiliation:
pdowben@unl.edu, University of Nebraska, Physics and Astronomy, P.O. Box 880111, 116 Brace Laboratory, Lincoln, NE, 68588-0111, United States, 402-472-9838, 402-2879
Ning Wu
Affiliation:
ningwu@bigred.unl.edu, University of Nebraska, Physics and Astronomy, United States
Natalie Palina
Affiliation:
palina@physik.uni-bonn.de, Universität Bonn, Physikalisches Institut, Germany
Hartwig Modrow
Affiliation:
modrow@physik.uni-bonn.de, Universität Bonn, Physikalisches Institut, Germany
Robert Müller
Affiliation:
robert.mueller@ipht-jena.de, Institut für Physikalische Hochtechnologie, Germany
Josef Hormes
Affiliation:
hormes@lsu.edu, Louisiana State University, Center for Advanced Microstructures and Devices, United States
Yaroslav B. Losovyj
Affiliation:
ylosovyj@lsu.edu, Louisiana State University, Center for Advanced Microstructures and Devices, United States
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Abstract

Nanostructured materials are not immune from surface segregation, as can be shown for solid samples made from nanosized BaFe12−2xCoxTixO19 barium ferrite particles and a variety of free clusters. Both theory and experiment provide ample demonstration that very limited dimensions of very small clusters does not necessarily impart stability against surface and grain boundary segregation. In fact, with the larger surface to volume ratio in small clusters and lower average atomic coordination, we anticipate that compositional instabilities in small clusters will readily occur.

Keywords

cluster assemblysurface chemistryphotoemission

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 887: Symposium Q – Degradation Processes in Nanostructured Materials , 2005 , 0887-Q05-01
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

[1] Dowben, P.A. and Miller, A., editors, Surface Segregation Phenomena, (CRC Press, Boston, 1990) p. 145.Google Scholar
[2] Dowben, P.A. and Jenkins, S.J., in Frontiers in Magnetic Materials, edited by Narlikar, Anant (Springer Verlag, 2005), pp. 295–325.Google Scholar
[3] Ristoiu, D., Nozières, J. P., Borca, C. N., Komesu, T., Jeong, H. -K. and Dowben, P. A., Europhys. Lett. 49, 624 (2000).Google Scholar
[4] Bona, G. L., Meier, F. and Taborelli, M., Solid State Commun. 56, 391 (1985).Google Scholar
[5] Zhu, W., Sinkovic, B., Vescovo, E., Tanaka, C. and Moodera, J. S., Phys. Rev. B 64, 060403 (2001).Google Scholar
[6] Borca, C.N., Xu, B., Komesu, T., Jeong, H.-K., Liu, M.T., Liou, S.-H., Stadler, S., Idzerda, Y. and Dowben, P. A., Europhys. Lett. 56, 722 (2001).Google Scholar
[7] Ritchie, L., Xiao, G., Ji, Y., Chen, T. Y., Chien, C. L., Zhang, M., Chen, J., Liu, Z., Wu, G. and Zhang, X.X., Phys. Rev. B 68, 104430 (2003).Google Scholar
[8] Plecenik, A., Fröhlich, K., Espinós, J. P., Holgado, J. P., Halabica, A., Pripko, M. and Gilabert, A., Appl. Phys. Lett. 81, 859 (2002).Google Scholar
[9] Ristoiu, D., Nozières, J. P., Broca, C. N., Borca, B. and Dowben, P.A., Appl. Phys. Lett. 76, 2349 (2000).Google Scholar
[10] Choi, J., Zhang, J., Liou, S.-H., Dowben, P.A. and Plummer, E.W., Phys. Rev. B 59, 13453 (1999).Google Scholar
[11] Dulli, H., Dowben, P.A., Liou, S.-H., Plummer, E.W., Phys. Rev. B 62, R14629 (2000).Google Scholar
[12] Dulli, H., Plummer, E.W., Dowben, P.A., Choi, J. and Liou, S.-H., Appl. Phys. Lett. 77, 570–572 (2000).Google Scholar
[13] Borca, C.N., Xu, Bo, Komesu, T., Jeong, H.-K., Liu, M.T., Liou, S.-H., Dowben, P.A., Surface Science Letters 512, L346 (2002).Google Scholar
[14] Caruso, A.N., Borca, C.N., Ristoiu, D., Nozières, J.P., Dowben, P.A., Surf. Sci. 525, L109–L115 (2003).Google Scholar
[15] Tchaplyguine, M., Lundwall, M., Gisselbrecht, M., Öhrwall, G., Feifel, R., Sorensen, S., Svensson, S., Mårtensson, N., Björneholm, O., Phys. Rev. A 69, 031201 (2004).Google Scholar
[16] Lundwall, M., Tchaplyguine, M., Öhrwall, G., Feifel, R., Lindblad, A., Lindgren, A., Sorensen, S., Svensson, S., Björneholm, O., Chem. Phys. Lett. 392, 433–438 (2004).Google Scholar
[17] Werner, H.W. and Garten, R P H, Rep. Prog. Phys. 47, 221 (1984).Google Scholar
[18] Hofmann, S., Surf. Interface Anal. 9, 3 (1986).Google Scholar
[19] Briggs, D. and Seah, M.P., editors, Practical Surface Analysis by XPS and AES, (Wiley, Chichester, 1983).Google Scholar
[20] Baun, W. L., Surf. Interface Anal. 3, 243 (1981).Google Scholar
[21] Benninghoven, S. A., Rudenauer, F. G. and Werner, H. W., Secondary Ion Mass Spectrometry, (Wiley, New York, 1987).Google Scholar
[22] Jeong, H.-K., Komesu, T., Yang, C.-S., Dowben, P. A., Schultz, B. D. and Palmstrøm, C. J., Mater. Lett. 58, 2993 (2004).Google Scholar
[23] Seah, M.P., Jones, M.E. and Anthony, M.T., Surf. Interface Anal. 6, 242 (1984).Google Scholar
[24] Seah, M.P., Surf. Interface Anal. 20, 243 (1993).Google Scholar
[25] Tanuma, S., Ichimura, S., and Yoshihara, K., Appl. Surf. Sci. 101, 47 (1996).Google Scholar
[26] NIST Electron Inelastic Mean Free Path program, ver. 1.1 (NST std. ref. Database 71) http://www.nist.gov.srd Google Scholar
[27] Dowben, P.A., Grunze, M. and Wright, D., Surf. Sci. 134, L524–L582 (1983).Google Scholar
[28] Vahalia, U., Dowben, P.A. and Miller, A., Electron, J. Spectrosc. Rel. Phenom. 37, 303 (1986).Google Scholar
[29] Tamura, S., Powell, C.J., and Penn, D.R., Surf. Interface Anal. 17, 911 (1991).Google Scholar
[30] Tamura, S., Powell, C.J., and Penn, D.R., Surf. Interface Anal. 21, 165 (1994).Google Scholar
[31] Powell, C.J. and Jablonski, A., Vac, J.. Sci. Technol. A 17, 1122 (1999).Google Scholar
[32] Schönhense, G. and Siegmann, H.C., Ann. Phys. (Leipzig) 2, 465 (1993).Google Scholar
[33] Drouhin, H.-J., Phys. Rev. B 56, 14886 (1997).Google Scholar
[34] Lundwall, M., Tchaplyguine, M., Öhrwall, G., Lindblad, A., Peredkov, S., Rander, T., Svensson, S., and Bjørneholm, O., Surface Sci. (2005) in pressGoogle Scholar
[35] Spanjaard, D., Guillot, C., Desjonqueres, M.-C., Treglia, G., and Lecante, J., Surf. Sci. Repts. 5, 1 (1985).Google Scholar
[36] Monnier, R., Phil. Mag. B 75, 67–144 (1997).Google Scholar
[37] Foiles, S.M., Phys. Rev. B 32, 7685 (1985).Google Scholar
[38] Finnis, M.W. and Sinclair, J.E., Phil. Mag. A 50, 45 (1984).Google Scholar
[39] Bozzolo, G., Ferrante, J., Noebe, R.D., Good, B., Honecy, F.S. and Abel, P., Comput. Mater. Sci. 15, 169 (1999).Google Scholar
[40] Deng, H., Hu, W., Shu, X. and Zhang, B., Appl. Surf. Sci. 221, 408 (2004).Google Scholar
[41] Moran-Lopez, J.L., Surf. Sci. Lett. 188, L472 (1987).Google Scholar
[42] Caruso, A.N. and Borca, C.N., in Recent Developments in Magnetism and Magnetic Materials 1, pp. 33–48 (2003).Google Scholar
[43] Liu, S. Y. and Kung, H. H., Surf. Sci. 110, 504 (1981).Google Scholar
[44] Knop, A., McIlroy, D.N., Dowben, P.A., and Rühl, E., in Two-Center Effects in IonAtom Collisions, Gay, T. J. and Starace, A.F. editors, (AIP Conference Proceedings 362, 1996) pp. 274–280.Google Scholar
[45] Yang, B., Asta, M., Mryasov, O.N., Klemmer, T.J. and Chantrell, R.W., Scripta Materialia 53, 417–422 (2005).Google Scholar
[46] Chepulskii, R.V., Velev, J. and Bulter, W.H., Appl, J.. Phys. 97, 10J311 (2005).Google Scholar
[47] Palina, Natalie, Modrow, H, Müller, R., Hormes, J., Dowben, P.A. and Losovyj, Ya.B., Materials Letter, (2005) in press.Google Scholar
[48] Kurisu, S., Ido, T. and Yokoyama, H., IEEE Trans. Magn. MAG- 23, 3137 (1987).Google Scholar
[49] Miller, A. and Dowben, P.A., Phys, J.. Cond. Matt. 5, 5459 (1993).Google Scholar