Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-27T02:05:59.679Z Has data issue: false hasContentIssue false

TCO Thin Films with Permittivity Control

Published online by Cambridge University Press:  31 January 2011

Timothy Gessert
Affiliation:
tim_gessert@nrel.gov, National Renewable Energy Lab, Golden, Colorado, United States
Yuki Yoshida
Affiliation:
yuki314@gmail.com, National Renewable Energy Lab, Golden, Colorado, United States
Christian Fesenmaier
Affiliation:
chrisfez@gmail.com, National Renewable Energy Lab, Golden, Colorado, United States
Joel Duenow
Affiliation:
joel_duenow@nrel.gov, National Renewable Energy Laboratory, Golden, Colorado, United States
Timothy Coutts
Affiliation:
tim_coutts@nrel.gov, National Renewable Energy Lab, Golden, Colorado, United States
Get access

Abstract

We have shown that variation in the real part of the dielectric permittivity of typical transparent conducting oxide (TCO) films can have a profound effect on the optical properties of the material. This has been demonstrated by adding small amounts of Zr to an ITO ceramic sputtering target and analyzing the resulting ITO and ITO:Zr (ITZO) films. Comparative electrical and optical analyses of the films show that, although the carrier concentration and mobility do not change appreciably by adding 1 wt.% ZrO2 to the ITO sputtering target, the plasma wavelength increases significantly for the ITZO film. We believe that the underlying physics of these results can be exploited in designing future TCO films for photovoltaic (PV) applications—especially those that embody industrial advantages but remain limited by low mobility.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Coutts, T., Young, D.L., and Li, X., MRS Bull. 25 (8) 58, (2000).Google Scholar
2. Coutts, T.J., Young, D.L., and Gessert, T.A., “Modeling, Characterization and Properties of Transparent Conducting Oxides,” Chapter 3 – Transparent Conducting Oxides, Springer, Expected Pub. Date 2009.Google Scholar
3. Gessert, T.A., Yoshida, Y., Fesenmaier, C.C., and Coutts, T.J., J. Appl. Phys. 105, (2009) (in press) press).Google Scholar
4. Wilk, G.D., Wallace, R.M., and Anthony, J.M., J. App. Phys. 89 (10), 5243 (2001).Google Scholar
5. Lucovsky, G. and Rayner, G.B. Jr., Appl. Phys. Lett. 77 (18), 2912 (2000).Google Scholar
6. Groth, R., Phys. Stat. Sol. 14, 69, (1966).Google Scholar
7. Koida, T. and Mondo, M., Appl. Phys Phys. Lett, 082104–1-082104–3 (2006).Google Scholar
8. Gessert, T.A., Yoshida, Y., and Coutts, T.J., U.S. Patent Application No. 11/718,628, May 4, 2007.Google Scholar
9.U. S. Patent Application PCT 07 07-42, Gessert, T.A., Duenow, J., Barnes, T., Coutts, T.J., September 2007.Google Scholar