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Team-based Interdisciplinary Materials Research using Image Processing

Published online by Cambridge University Press:  21 March 2011

Jacquelynn Garofano ,
Thomas Sadowski ,
John DaPonte  and
Christine Broadbridge
Jacquelynn Garofano
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, CT Center for Research on Interface Structures and Phenomena (CRISP), Yale/SCSU
Thomas Sadowski
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, CT Department of Computer Science, Southern Connecticut State University, New Haven, CT
John DaPonte
Affiliation:
Department of Computer Science, Southern Connecticut State University, New Haven, CT
Christine Broadbridge
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, CT Center for Research on Interface Structures and Phenomena (CRISP), Yale/SCSU
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Abstract

There is an acute and well-documented need for image processing of microscopy data in materials science regarding, for example, the characterization of the structure/property relationship of a given materials system. In our work, image processing has been used as a framework for conducting interdisciplinary team-based research that effectively integrates programs within the Center for Research on Interface Structures and Phenomena (CRISP) Materials Research Science and Engineering Center (MRSEC), e.g. research experiences for undergraduates (REU), teachers (RET) and high school fellowships. This research resulted from a five-year long collaboration between CRISP and the Physics and Computer Science Departments at Southern Connecticut State University (SCSU). This paper will focus on the implementation of team-based research experiences as a vehicle for interdisciplinary science and education. Representative results of several of the studies are presented and discussed.

Keywords

scanning electron microscopy (SEM)transmission electron microscopy (TEM)scanning probe microscopy (SPM)

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1320: Symposium XX – Materials Education Development and Outreach—From K-Grad , 2011 , mrsf10-1320-xx03-04
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. http://www.crisp.yale.edu/index.php/Education_Outreach Google Scholar
2. Broadbridge, C., et al. , Mater. Res. Soc. Symp. Proc. 1233 PP10–03 (2010).Google Scholar
3. Woehrle, G., Hutchison, J., Ozkar, S., Finke, R., J. Chem. 30 109 (2003).Google Scholar
4. http://rsbweb.nih.gov/ij/ Google Scholar
5. Vincent, L., Soellie, P., IEEE Trans. Pattern Anal. Mach. Intell. 13 583 (1991)Google Scholar
6. Daponte, J., et al. , Proc. SPIE 6768 676807 (2007).Google Scholar
7. Sawicki, M., et al. , Proc. SPIE 7243 724305 (2009).Google Scholar
8. Daponte, J., et al. , Proc. SPIE 6575 65750L (2007).Google Scholar
9. Shaoo, P.K., Soltani, S., Wong, A.K.C., Comp. Vis. Graph., Im. Proc. 41 233 (1988).Google Scholar
10. Sezgin, M., Sankur, B., J. Electron. Imaging 13 146 (2004).Google Scholar
11. Daponte, J., et al. , Proc. SPIE 6575 65750H (2007).Google Scholar
12. Day, D., “Platinum Nanoparticle Synthesis, Characterization, and Interaction with Polymeric Bis(methylthio)maleonitrile Derivatives” M.S. thesis, SCSU (2006).Google Scholar
13. Kolpak, A., et al. , Phys. Rev. Lett. 105 217601 (2010).Google Scholar
14. Sadowski, T., et al. , Mater. Res. Soc. Symp. Proc. 894 LL03–06 (2006).Google Scholar
Pechkis, D.L., “The Microstructural Characterization of Thin Film Ferroelectrics for Electronic Applications” Honors Thesis, SCSU (2001).Google Scholar
16. Niedzielski, B., et al. , Proc. SPIE 7538 75380B (2010).Google Scholar
17. Krishna, D., Daponte, J., Broadbridge, C.C., et al. , Proc. SPIE 7701 77010U (2010).Google Scholar
18. Shanbhag, A.G., CVGIP: Graph. Models Image Process. 56 414 (1994).Google Scholar