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Transient Processes at the SI-Water Interface During Pulsed Laser Irradiation

Published online by Cambridge University Press:  26 February 2011

A. Polman ,
W. Sinke ,
M. J. Utitormark  and
Michael O. Thompson
A. Polman
Affiliation:
FOM-Institute for Atomic and Molecular Physics Kruislaan 407, 1098 SJ Amsterdam, The Netherlands
W. Sinke
Affiliation:
FOM-Institute for Atomic and Molecular Physics Kruislaan 407, 1098 SJ Amsterdam, The Netherlands
M. J. Utitormark
Affiliation:
Department of Materials Science Cornell University, Ithaca, NY 14853, USA
Michael O. Thompson
Affiliation:
Department of Materials Science Cornell University, Ithaca, NY 14853, USA
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Abstract

Heat transfer processes and phase transitions at the Si-water interface during nanosecond pulsed laser irradiation were studied in real time using transient optical reflectance measurements. Measurements at two probe laser polarizations suggest that during irradiation a steam phase is formed near the Si surface. Relaxation of this phase occurs several hundred nanoseconds after solidification of the Si is completed. Acousto-optical measurements indicate that a shock wave, propagating with the sound velocity in water, is initiated near the Si-water interface.

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References

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