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Transmission Electron Microscopy (TEM) Studies of Interfaces in TiB2-ZrO2 Composites

Published online by Cambridge University Press:  10 February 2011

S. Stemmer ,
J. Vleugels  and
O. Van Der Biest
S. Stemmer
Affiliation:
Department of Metallurgy and Materials Engineering (MTM), Katholieke Universiteit Leuven, de Croylaan 2, B-3001 Leuven, Belgium
J. Vleugels
Affiliation:
Department of Metallurgy and Materials Engineering (MTM), Katholieke Universiteit Leuven, de Croylaan 2, B-3001 Leuven, Belgium
O. Van Der Biest
Affiliation:
Department of Metallurgy and Materials Engineering (MTM), Katholieke Universiteit Leuven, de Croylaan 2, B-3001 Leuven, Belgium
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Abstract

TEM studies of the microstructure and of chemical reactions at interfaces in TiB2-ZrO2 composites are presented. Samples with 70 vol% of Y2O3-stabilized ZrO sintered at 1700 °C showed reaction zones around the TiB2 grains, that consisted of a solid-solution of TiO2 and ZrO2(Y2O3). In addition, nontransformable, tetragonal t'-ZrO2 was observed in these samples. In contrast, the interphase boundaries in composites sintered at 1450 °C contained no reaction products, and the ZrO2 matrix consisted of small, transformable tetragonal grains, as required for transformation toughening of the composites.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 458: Symposium W – Interfacial Engineering for Optimized Properties , 1996 , 133
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

[1] Shobu, K., Watanabe, T., Drennan, J., Hannink, R.H.J., Swam, M.V., in Advances in Ceramics 24, edited by Somiya, S., Yamamoto, N., Yanagida, H. (The American Ceramic Society, Columbus, 1988) p. 1091.Google Scholar
[2] Telle, R., Petzow, G., Mat. Sci. Eng. A 105/106, 97 (1988).Google Scholar
[3] Vleugels, J., Van Der Biest, O., to be published.Google Scholar
[4] Lanteri, V., Chaim, R., Heuer, A.H., J. Am. Ceram. Soc. 69, C258 (1986).Google Scholar
[5] Ingei, R.P., Lewis, D. III, J. Am. Ceram. Soc. 69, 325 (1986).Google Scholar
[6] CLin, L., Gan, D., Shen, P., Mat. Sci. Eng. A 129, 147 (1990).Google Scholar
[7] Lange, F.F., J. Am. Ceram. Soc. 69, 240 (1986).Google Scholar
[8] Vleugels, J., private communication.Google Scholar
[9] Cheng, Y.-B., Thompson, D.P., J. Am. Ceram. Soc. 74, 1135 (1991).Google Scholar
[10] Tsukuma, K., Takahata, T., Tsukidate, T., in Advances in Ceramics 24, edited by Somiya, S., Yamamoto, N., Yanagida, H. (The American Ceramic Society, Columbus, 1988) p. 287.Google Scholar
[11] Martinez-Fernandez, J., Jiménez-Melendo, M., Domínguez-Rodríguez, A., J. Mater. Res. 11, 1972 (1996).Google Scholar
[12] Rühle, M., Claussen, N., Heuer, A.H., in: Advances in Ceramics 12, edited by Claussen, N., Rühle, M., Heuer, A.H. (The American Ceramic Society, Columbus, 1984) p. 352.Google Scholar
[13] Clarke, D.R., J. de Physique 46, C4–51 (1985).Google Scholar