Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Chen, W.M.
McNally, P.J.
Shvydko, Yu.V.
Tuomi, T.
Lerche, M.
Danilewsky, A.N.
Kanatharana, J.
Lowney, D.
O'Hare, M.
Knuuttila, L.
Riikonen, J.
and
Rantam�ki, R.
2001.
Quality Assessment of Sapphire Wafers for X-Ray Crystal Optics Using White Beam Synchrotron X-Ray Topography.
physica status solidi (a),
Vol. 186,
Issue. 3,
p.
365.