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Characterizing nanoparticles with a laboratory diffractometer: from small-angle to total X-ray scattering

Published online by Cambridge University Press:  10 November 2014

Marco Sommariva*
Affiliation:
PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
Milen Gateshki
Affiliation:
PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
Jan-André Gertenbach
Affiliation:
PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
Joerg Bolze
Affiliation:
PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
Uwe König
Affiliation:
PANalytical B.V., Lelyweg 1, 7602 EA Almelo, The Netherlands
Bogdan Ştefan Vasile
Affiliation:
Faculty of Applied Chemistry and Materials Science, Department of Science and Engineering of Oxide Materials and Nanomaterials, University Politehnica from Bucharest, No. 1-7 Gh. Polizu Street, 011061 Bucharest, Romania
Vasile-Adrian Surdu
Affiliation:
Faculty of Applied Chemistry and Materials Science, Department of Science and Engineering of Oxide Materials and Nanomaterials, University Politehnica from Bucharest, No. 1-7 Gh. Polizu Street, 011061 Bucharest, Romania
*
a)Author to whom correspondence should be addressed. Electronic mail: marco.sommariva@panalytical.com

Abstract

X-ray diffraction and scattering on a single multipurpose X-ray platform have been used to probe the structure, composition, and thermal behavior of TiO2 nanoparticles ranging in size from 1 to 10 nm. Ambient and non-ambient Bragg diffraction, small-angle X-ray scattering (SAXS), as well as total scattering and pair-distribution function (PDF) analysis are combined to obtain a comprehensive picture of the samples. At these ultrasmall particle-size dimensions, SAXS and PDF prove powerful in distinguishing the salient features of the materials, in particular the size distribution of the primary particles (SAXS) and the identification of the TiO2 polymorphs (PDF). Structural features determined by X-ray scattering techniques are corroborated by high-resolution transmission electron microscopy. The elemental make-up of the materials has been measured using X-ray fluorescence spectrometry and energy-dispersive X-ray analysis.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2014 

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