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F-66 Mg-Based Multilayer XRF Analyzers with Two- and Three-Layers Structure Design

Published online by Cambridge University Press:  20 May 2016

Y. Platonov
Affiliation:
Rigaku Innovative Technologies, Auburn Hills, MI
J. Rodriguez
Affiliation:
Rigaku Innovative Technologies, Auburn Hills, MI
G. Fournier
Affiliation:
Rigaku Innovative Technologies, Auburn Hills, MI
K. Shimizu
Affiliation:
Rigaku Industrial Corporation, Osaka, Japan

Abstract

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Type
DENVER X-RAY CONFERENCE
Copyright
Copyright © Cambridge University Press 2008

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