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Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

Published online by Cambridge University Press:  10 January 2013

S. Pratapa ,
B. H. O’Connor  and
I-M. Low
S. Pratapa
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
B. H. O’Connor*
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
I-M. Low
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
*
b)To whom correspondence should be addressed.
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Abstract

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application—determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

Keywords

Compton scatteringX-ray fluorescence spectrometrymass attenuation correctionsRietveld phase analysisaluminium titanate/zirconia-alumina ceramicfunctionally-graded

Information

Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 3 , September 1998 , pp. 166 - 170
Copyright
Copyright © Cambridge University Press 1998

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