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X-ray characterization of crosslinked methacrylate copolymers for application as dielectric layers in organic electronics

Published online by Cambridge University Press:  25 July 2019

Dieter Jehnichen ,
Doris Pospiech ,
Andreas Berndt ,
Selina C. Gomoll ,
Eva Natkowski  and
Matthias Plötner
Dieter Jehnichen*
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Doris Pospiech
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Andreas Berndt
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Selina C. Gomoll
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Eva Natkowski
Affiliation:
Leibniz-Institut für Polymerforschung Dresden e.V., Hohe Str. 6, D-01069 Dresden, Germany
Matthias Plötner
Affiliation:
Technische Universität Dresden, Institute of Semiconductors and Microsystems (Institut für Halbleiter- und Mikrosystemtechnik), D-01062 Dresden, Germany
*
a)Author to whom correspondence should be addressed. Electronic mail: djeh@ipfdd.de
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Abstract

Poly(methyl methacrylate) (PMMA) is one of the most important polymers for application as a dielectric layer in organic electronics, e.g. in organic field-effect transistors. The key to improve the transistor performance is the optimization of the interface between the semiconductor and the dielectric layer. Here, the surface order in thin films of PMMA copolymers with self-organized, semifluorinated (sf) building blocks, and crosslinkable units in single layers and double layers with poly(3-hexylthiophene-2,5-diyl) (P3HT) is investigated. The chemistry of the sf copolymers is systematically varied and the influence on the self-organization in bulk and thin films is examined by a combination of scattering methods. The length of the semifluorinated side chains mainly determines the degree and type of order both in bulk as well as in thin films.

Keywords

X-ray scatteringdielectric layerPMMA copolymersemifluorinatedthin filmmultilayer characterization
Type
Technical Articles
Information
Powder Diffraction , Volume 34 , Supplement S1 , September 2019 , pp. S71 - S81
Copyright
Copyright © International Centre for Diffraction Data 2019 

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Footnotes

*

Present Address: POLY-CHEM GmbH, Bitterfeld-Wolfen, Germany.

†

Present Address: FEW Chemicals GmbH, Bitterfeld-Wolfen, Germany.

‡

Present Address: Gustav-Adolph-Str. 36, 09116 Chemnitz, Germany, E-mail: eva.natkowki@web.de.

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